Lutterotti Luca
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Crystallography Open Database–an open-access collection of crystal structures
S Gražulis, D Chateigner, RT Downs, AFT Yokochi, M Quirós, L Lutterotti, ...
Journal of applied crystallography 42 (4), 726-729, 2009
MAUD: a friendly Java program for material analysis using diffraction
L Lutterotti, S Matthies, HR Wenk
Newsletter of the CPD 21, 14-15, 1999
Crystallography Open Database (COD): an open-access collection of crystal structures and platform for world-wide collaboration
S Gražulis, A Daškevič, A Merkys, D Chateigner, L Lutterotti, M Quiros, ...
Nucleic acids research 40 (D1), D420-D427, 2012
Total pattern fitting for the combined size–strain–stress–texture determination in thin film diffraction
L Lutterotti
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2010
Combined Texture and structure analysis of deformed limestone from time-of-flight neutron diffraction spectra
L Lutterotti, S Matthies, HR Wenk, AS Schultz, R Jr.
J. Applied Physics 81 (2), 594-600, 1997
Simultaneous structure and size–strain refinement by the Rietveld method
L Lutterotti, P Scardi
Journal of applied Crystallography 23 (4), 246-252, 1990
Texture, residual stress and structural analysis of thin films using a combined X-ray analysis
L Lutterotti, D Chateigner, S Ferrari, J Ricote
Thin Solid Films 450 (1), 34-41, 2004
Rietveld texture analysis from diffraction images
L Lutterotti, M Bortolotti, G Ischia, I Lonardelli, HR Wenk
Z. Kristallogr. Suppl 26, 125-130, 2007
MAUD (material analysis using diffraction): a user friendly Java program for Rietveld texture analysis and more
L Lutterotti, H Wenk, S Matthies
Proceeding of the twelfth international conference on textures of materials …, 1999
Method for the simultaneous determination of anisotropic residual stresses and texture by x‐ray diffraction
M Ferrari, L Lutterotti
Journal of Applied Physics 76 (11), 7246-7255, 1994
Texture analysis with the new HIPPO TOF diffractometer
HR Wenk, L Lutterotti, S Vogel
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2003
X-ray diffraction characterization of heavily deformed metallic specimens
L Lutterotti, S Gialanella
Acta Materialia 46 (1), 101-110, 1998
LSI-a computer program for simultaneous refinement of material structure and microstructure
L Lutterotti, P Scardi, P Maistrelli
Journal of applied crystallography 25 (3), 459-462, 1992
Quantitative analysis of silicate glass in ceramic materials by the Rietveld method
L Lutterotti, R Ceccato, R Dal Maschio, E Pagani
Materials Science Forum 278 (281), 87-92, 1998
Rietveld texture analysis from TOF neutron diffraction data
HR Wenk, L Lutterotti, SC Vogel
Powder Diffraction 25 (3), 283-296, 2010
In situ observation of texture evolution during α→ β and β→ α phase transformations in titanium alloys investigated by neutron diffraction
I Lonardelli, N Gey, HR Wenk, M Humbert, SC Vogel, L Lutterotti
Acta Materialia 55 (17), 5718-5727, 2007
Maud: a Rietveld analysis program designed for the internet and experiment integration
L Lutterotti
Acta Crystallogr. Sect. A Found. Crystallogr 56, s54, 2000
Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis
L Lutterotti, R Vasin, HR Wenk
Powder Diffraction 29 (1), 76-84, 2014
Advances in texture analysis from diffraction spectra
S Matthies, L Lutteroti, HR Wenk
Journal of Applied Crystallography 30 (1), 31-42, 1997
Texture measurements using the new neutron diffractometer HIPPO and their analysis using the Rietveld method
SC Vogel, C Hartig, L Lutterotti, RB Von Dreele, HR Wenk, DJ Williams
Powder Diffraction 19 (1), 65-68, 2004
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