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Tanja Stimpel-Lindner
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The role of MOFs in thin-film nanocomposite (TFN) membranes
C Van Goethem, R Verbeke, M Pfanmöller, T Koschine, M Dickmann, ...
Journal of membrane science 563, 938-948, 2018
1112018
Quantum confinement-induced semimetal-to-semiconductor evolution in large-area ultra-thin PtSe2 films grown at 400 °C
L Ansari, S Monaghan, N McEvoy, CÓ Coileáin, CP Cullen, J Lin, R Siris, ...
npj 2D Materials and Applications 3 (1), 33, 2019
792019
Liquid phase exfoliation of MoO 2 nanosheets for lithium ion battery applications
JB Boland, A Harvey, R Tian, D Hanlon, V Vega-Mayoral, B Szydlowska, ...
Nanoscale Advances 1 (4), 1560-1570, 2019
422019
Annealing and deposition effects of the chemical composition of silicon-rich nitride
KN Andersen, WE Svendsen, T Stimpel-Lindner, T Sulima, ...
Applied surface science 243 (1-4), 401-408, 2005
382005
The role of atomic hydrogen in pre-epitaxial silicon substrate cleaning
A Aßmuth, T Stimpel-Lindner, O Senftleben, A Bayerstadler, T Sulima, ...
Applied surface science 253 (20), 8389-8393, 2007
362007
STM studies of C60 on a Si (1 1 1): B surface phase
T Stimpel, M Schraufstetter, H Baumgärtner, I Eisele
Materials Science and Engineering: B 89 (1-3), 394-398, 2002
332002
Hybrid Devices by Selective and Conformal Deposition of PtSe2 at Low Temperatures
M Prechtl, S Parhizkar, O Hartwig, K Lee, J Biba, T Stimpel‐Lindner, F Gity, ...
Advanced Functional Materials 31 (46), 2103936, 2021
302021
Sub-millimeter size high mobility single crystal MoSe 2 monolayers synthesized by NaCl-assisted chemical vapor deposition
J Li, W Yan, Y Lv, J Leng, D Zhang, CÓ Coileáin, CP Cullen, ...
RSC advances 10 (3), 1580-1587, 2020
292020
Covalent Bisfunctionalization of Two‐Dimensional Molybdenum Disulfide
X Chen, C Bartlam, V Lloret, N Moses Badlyan, S Wolff, R Gillen, ...
Angewandte Chemie International Edition 60 (24), 13484-13492, 2021
272021
Defect Engineering of Two‐Dimensional Molybdenum Disulfide
X Chen, P Denninger, T Stimpel‐Lindner, E Spiecker, GS Duesberg, ...
Chemistry–A European Journal 26 (29), 6535-6544, 2020
262020
Real-scale chlorination at pH4 of BW30 TFC membranes and their physicochemical characterization
R Verbeke, V Gomez, T Koschine, S Eyley, A Szymczyk, M Dickmann, ...
Journal of membrane science 551, 123-135, 2018
252018
Spectroscopic thickness and quality metrics for PtSe2 layers produced by top-down and bottom-up techniques
BM Szydłowska, O Hartwig, B Tywoniuk, T Hartman, T Stimpel-Lindner, ...
2D Materials 7 (4), 045027, 2020
232020
Highly Sensitive, Selective, Stable, and Flexible NO2 Sensor Based on GaSe
YF Zhao, HR Fuh, CÓ Coileáin, CP Cullen, T Stimpel‐Lindner, ...
Advanced Materials Technologies 5 (4), 1901085, 2020
232020
Synthesis of tungsten ditelluride thin films and highly crystalline nanobelts from pre-deposited reactants
JB Mc Manus, C Ilhan, B Balsamo, C Downing, CP Cullen, ...
Tungsten 2, 321-334, 2020
142020
The formation of silicon (111) boron surface phases and their influence on the epitaxial growth of silicon and germanium
J Schulze, H Baumgärtner, C Fink, G Dollinger, I Gentchev, L Görgens, ...
Thin Solid Films 369 (1-2), 10-15, 2000
142000
Highly Selective Non‐Covalent On‐Chip Functionalization of Layered Materials
R Tilmann, C Weiss, CP Cullen, L Peters, O Hartwig, L Hoeltgen, ...
Advanced Electronic Materials 7 (7), 2000564, 2021
122021
In-situ STM studies of the self-assembling formation of boron surface phases on Si (111)
T Stimpel, J Schulze, HE Hoster, I Eisele, H Baumgärtner
Applied surface science 162, 384-389, 2000
122000
Probing the impact of tribolayers on enhanced wear resistance behavior of carbon-rich molybdenum-based coatings
D Dinesh Kumar, S Hazra, K Panda, P Kuppusami, T Stimpel-Lindner, ...
ACS applied materials & interfaces 14 (22), 26148-26161, 2022
112022
Boron surface phase on Si (111): atomic structure and Si overgrowth studied by scanning tunneling microscopy and work function measurement
T Stimpel, HE Hoster, J Schulze, H Baumgärtner, I Eisele
Thin Solid Films 380 (1-2), 29-31, 2000
92000
Interface morphology in strained layer epitaxy of Si/Ge layers studied by x-ray scattering under grazing incidence and atomic force microscopy
Z Kovats, T Salditt, TH Metzger, J Peisl, T Stimpel, H Lorenz, JO Chu, ...
Journal of Physics D: Applied Physics 32 (4), 359, 1999
71999
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