| High accuracy stimulus generation for A/D converter BIST A Roy, S Sunter, A Fudoli, D Appello Proceedings. International Test Conference, 1031-1039, 2002 | 64 | 2002 |
| System-in-package testing: problems and solutions D Appello, P Bernardi, M Grosso, MS Reorda IEEE Design & Test of Computers 23 (3), 203-211, 2006 | 58 | 2006 |
| Exploiting programmable BIST for the diagnosis of embedded memory cores D Appello, P Bernardi, A Fudoli, M Rebaudengo, MS Reorda, V Tancorre, ... International Test Conference, 2003. Proceedings. ITC 2003., 379-379, 2003 | 53 | 2003 |
| Small-delay-defect testing R Mattiuzzo, D Appello, C Allsup EDN (Electrical Design News) 54 (13), 28, 2009 | 37 | 2009 |
| Understanding yield losses in logic circuits D Appello, A Fudoli, K Giarda, V Tancorre, E Gizdarski, B Mathew IEEE Design & Test of Computers 21 (3), 208-215, 2004 | 35 | 2004 |
| Adapting to adaptive testing EJ Marinissen, A Singh, D Glotter, M Esposito, JM Carulli, A Nahar, ... 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010 | 34 | 2010 |
| Embedded memory diagnosis: An industrial workflow D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ... 2006 IEEE International Test Conference, 1-9, 2006 | 28 | 2006 |
| A comprehensive methodology for stress procedures evaluation and comparison for burn-in of automotive SoC D Appello, P Bernardi, G Giacopelli, A Motta, A Pagani, G Pollaccia, ... Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017 | 24 | 2017 |
| On the automation of the test flow of complex SoCs D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ... 24th IEEE VLSI Test Symposium, 6 pp.-171, 2006 | 23 | 2006 |
| Yield analysis of logic circuits D Appello, A Fudoli, K Giarda, E Gizdarski, B Mathew, V Tancorre 22nd IEEE VLSI Test Symposium, 2004. Proceedings., 103-108, 2004 | 21 | 2004 |
| System-level test: State of the art and challenges D Appello, HH Chen, M Sauer, I Polian, P Bernardi, MS Reorda 2021 IEEE 27th International Symposium on On-Line Testing and Robust System …, 2021 | 19 | 2021 |
| A P1500 compliant BIST-based approach to embedded RAM diagnosis D Appello, F Corno, M Giovinetto, M Rebaudengo, MS Reorda Proceedings 10th Asian Test Symposium, 97-102, 2001 | 19 | 2001 |
| Effective screening of automotive socs by combining burn-in and system level test F Almeida, P Bernardi, D Calabrese, M Restifo, MS Reorda, D Appello, ... 2019 IEEE 22nd International Symposium on Design and Diagnostics of …, 2019 | 18 | 2019 |
| Evaluating alpha-induced soft errors in embedded microprocessors P Rech, S Gerardin, A Paccagnella, P Bernardi, M Grosso, MS Reorda, ... 2009 15th IEEE International On-Line Testing Symposium, 69-74, 2009 | 15 | 2009 |
| Device selection for failure analysis of chain fails using diagnosis driven yield analysis C Schuermyer, B Benware, G Rhodes, D Appello, V Tancorre, O Riewer International Symposium for Testing and Failure Analysis 38268, 91-97, 2011 | 14 | 2011 |
| A practical evaluation of I/sub DDQ/test strategies for deep submicron production test application. Experiences and targets from the field A Fudoli, A Ascagni, D Appello, H Manhaeve The Eighth IEEE European Test Workshop, 2003. Proceedings., 65-70, 2003 | 14 | 2003 |
| An optimized test during burn-in for automotive SoC D Appello, C Bugeja, G Pollaccia, P Bernardi, R Cantoro, M Restifo, ... IEEE Design & Test 35 (3), 46-53, 2018 | 13 | 2018 |
| Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core P Rech, A Paccagnella, M Grosso, MS Reorda, F Melchiori, D Loparco, ... IEEE Transactions on Nuclear Science 57 (4), 2098-2105, 2010 | 13 | 2010 |
| A BIST-based solution for the diagnosis of embedded memories adopting image processing techniques D Appello, A Fudoli, V Tancorre, P Bernardi, F Corno, M Rebaudengo, ... Journal of Electronic Testing 20, 79-87, 2004 | 13 | 2004 |
| Embedded memory fail analysis for production yield enhancement Y Baltagi, DL Rosi, V Tancorre, C Garagnon, E Faehn, M Barone, ... 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, 1-5, 2011 | 12 | 2011 |
