Mario B Viani
Mario B Viani
Asylum Research
Patvirtintas el. paštas
Molecular mechanistic origin of the toughness of natural adhesives, fibres and composites
BL Smith, TE Schäffer, M Viani, JB Thompson, NA Frederick, J Kindt, ...
Nature 399 (6738), 761-763, 1999
Small cantilevers for force spectroscopy of single molecules
MB Viani, TE Schäffer, A Chand, M Rief, HE Gaub, PK Hansma
Journal of Applied Physics 86 (4), 2258-2262, 1999
Probing protein–protein interactions in real time
MB Viani, LI Pietrasanta, JB Thompson, A Chand, IC Gebeshuber, ...
nature structural biology 7 (8), 644-647, 2000
Fast imaging and fast force spectroscopy of single biopolymers with a new atomic force microscope designed for small cantilevers
MB Viani, TE Schäffer, GT Paloczi, LI Pietrasanta, BL Smith, JB Thompson, ...
Review of Scientific Instruments 70 (11), 4300-4303, 1999
Finite optical spot size and position corrections in thermal spring constant calibration
R Proksch, TE Schäffer, JP Cleveland, RC Callahan, MB Viani
Nanotechnology 15 (9), 1344, 2004
Microfabricated small metal cantilevers with silicon tip for atomic force microscopy
A Chand, MB Viani, TE Schaffer, PK Hansma
Journal of microelectromechanical systems 9 (1), 112-116, 2000
Microfabrication of cantilevers using sacrificial templates
MB Viani, P Hansma, A Chand, MA Wendman, HJ Morrett
US Patent 6,016,693, 2000
Practical loss tangent imaging with amplitude-modulated atomic force microscopy
R Proksch, M Kocun, D Hurley, M Viani, A Labuda, W Meinhold, J Bemis
Journal of Applied Physics 119 (13), 2016
Atomic force microscope for small cantilevers
TE Schäffer, M Viani, DA Walters, B Drake, EK Runge, JP Cleveland, ...
Micromachining and Imaging 3009, 48-52, 1997
Photothermal excitation for improved cantilever drive performance in tapping mode atomic force microscopy
A Labuda, J Cleveland, NA Geisse, M Kocun, B Ohler, R Proksch, ...
Microscopy and analysis, 21-25, 2014
Atomic force microscopy using small cantilevers
DA Walters, M Viani, GT Paloczi, TE Schaeffer, JP Cleveland, ...
Micromachining and Imaging 3009, 43-47, 1997
Atomic force microscope detector drift compensation by correlation of similar traces acquired at different setpoints
JH Kindt, JB Thompson, MB Viani, PK Hansma
Review of scientific instruments 73 (6), 2305-2307, 2002
Recent highlights from atomic force microscopy of DNA
HG Hansma, LI Pietrasanta, R Golan, JC Sitko, MB Viani, GT Paloczi, ...
Journal of Biomolecular Structure and Dynamics 17 (sup1), 271-275, 2000
Modular atomic force microscope
R Proksch, M Viani, J Cleveland, M Rutgers, M Klonowski, D Walters, ...
US Patent 8,370,960, 2013
Methods for biological probe microscopy in aqueous fluids
JH Kindt, JC Sitko, LI Pietrasanta, E Oroudjev, N Becker, MB Viani, ...
Methods Cell Biol 68, 213-229, 2002
Fully digital controller for cantilever-based instruments
R Proksch, J Cleveland, D Bocek, T Day, M Viani, C Callahan
US Patent 7,234,342, 2007
Array detector for the atomic force microscope
TE Schäffer, M Richter, MB Viani
Applied Physics Letters 76 (24), 3644-3646, 2000
Exploring flatland: AFM of mechanical and electrical properties of graphene, MoS2 and other low-dimensional materials
S Bertolazzi, J Brivio, A Radenovic, A Kis, H Wilson, L Prisbrey, E Minot, ...
Microscopy and Analysis 27 (3), 2013
Fully digitally controller for cantilever-based instruments
R Proksch, J Cleveland, D Bocek, T Day, MB Viani, C Callahan
US Patent 7,937,991, 2011
Modular atomic force microscope with environmental controls
M Viani, R Proksch, M Rutgers, J Cleveland, J Hodgson
US Patent 9,097,737, 2015
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