Follow
Nico Klingner
Title
Cited by
Cited by
Year
Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry
N Klingner, R Heller, G Hlawacek, J von Borany, J Notte, J Huang, ...
Ultramicroscopy 162, 91-97, 2016
592016
Wafer-scale nanofabrication of telecom single-photon emitters in silicon
M Hollenbach, N Klingner, NS Jagtap, L Bischoff, C Fowley, U Kentsch, ...
Nature Communications 13 (7683), 2022
412022
Threshold and efficiency for perforation of 1 nm thick carbon nanomembranes with slow highly charged ions
RA Wilhelm, E Gruber, R Ritter, R Heller, A Beyer, A Turchanin, ...
2D Materials 2 (3), 035009, 2015
252015
Lithium ion beams from liquid metal alloy ion sources
W Pilz, N Klingner, L Bischoff, P Mazarov, S Bauerdick
Journal of Vacuum Science & Technology B 37 (2), 2019
222019
Time-of-flight secondary ion mass spectrometry in the helium ion microscope
N Klingner, R Heller, G Hlawacek, S Facsko, J von Borany
Ultramicroscopy 198, 10-17, 2019
222019
Universal radiation tolerant semiconductor
A Azarov, JG Fernández, J Zhao, F Djurabekova, H He, R He, Ø Prytz, ...
Nature Communications 14 (1), 4855, 2023
202023
Visualization and Chemical Characterization of the Cathode Electrolyte Interphase Using He-Ion Microscopy and In Situ Time-of-Flight Secondary Ion Mass …
L Wheatcroft, N Klingner, R Heller, G Hlawacek, D Özkaya, J Cookson, ...
ACS Applied Energy Materials 3 (9), 8822-8832, 2020
202020
Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector
E Serralta, N Klingner, O De Castro, M Mousley, S Eswara, SD Pinto, ...
Beilstein Journal of Nanotechnology 11 (1), 1854-1864, 2020
162020
Quantum oscillations and ferromagnetic hysteresis observed in iron filled multiwall carbon nanotubes
J Barzola-Quiquia, N Klingner, J Krüger, A Molle, P Esquinazi, ...
Nanotechnology 23 (1), 015707, 2011
162011
Imaging and milling resolution of light ion beams from helium ion microscopy and FIBs driven by liquid metal alloy ion sources
N Klingner, G Hlawacek, P Mazarov, W Pilz, F Meyer, L Bischoff
Beilstein Journal of Nanotechnology 11 (1), 1742-1749, 2020
152020
npSCOPE: A New Multimodal Instrument for In Situ Correlative Analysis of Nanoparticles
O De Castro, A Biesemeier, E Serralta, O Bouton, R Barrahma, QH Hoang, ...
Analytical Chemistry 93 (43), 14417-14424, 2021
142021
Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns
M Mousley, S Eswara, O De Castro, O Bouton, N Klingner, CT Koch, ...
Beilstein Journal of Nanotechnology 10 (1), 1648-1657, 2019
142019
Effects of alloying elements on surface oxides of hot–dip galvanized press hardened steel
W Gaderbauer, M Arndt, T Truglas, T Steck, N Klingner, D Stifter, J Faderl, ...
Surface and Coatings Technology 404, 126466, 2020
122020
Modelling of focused ion beam induced increases in sample temperature: a case study of heat damage in biological samples
A WOLFF, N KLINGNER, W THOMPSON, Y ZHOU, J LIN, YY PENG, ...
Journal of Microscopy, 2018
122018
Morphology modifcation of Si nanopillars under ion irradiation at elevated temperatures: plastic deformation and controlled thinning to 10nm
X Xu, KH Heinig, W Möller, HJ Engelmann, N Klingner, A Gharbi, R Tiron, ...
Semiconductor Science and Technology 35, 015021, 2019
112019
Roadmap for focused ion beam technologies
K Höflich, G Hobler, FI Allen, T Wirtz, G Rius, L McElwee-White, ...
Applied Physics Reviews 10 (4), 2023
102023
Boron liquid metal alloy ion sources for special focused ion beam applications
L Bischoff, N Klingner, P Mazarov, W Pilz, F Meyer
Journal of Vacuum Science & Technology B 38 (4), 2020
82020
Backscattering Spectrometry in the Helium Ion Microscope: Imaging Elemental Compositions on the nm Scale
R Heller, N Klingner, G Hlawacek
Helium Ion Microscopy, 265-295, 2016
62016
Optimizing the Rutherford Backscattering Spectrometry setup in a nuclear microprobe
N Klingner, J Vogt, D Spemann
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2013
62013
Quantitative elemental microscopy on lateral highly inhomogeneous meteorite samples using ion beam analysis
R Wunderlich, N Klingner, J Vogt, D Spemann
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2013
52013
The system can't perform the operation now. Try again later.
Articles 1–20