Follow
Tom Wirtz
Tom Wirtz
Verified email at list.lu
Title
Cited by
Cited by
Year
Intrinsic halide segregation at nanometer scale determines the high efficiency of mixed cation/mixed halide perovskite solar cells
P Gratia, G Grancini, JN Audinot, X Jeanbourquin, E Mosconi, ...
Journal of the American Chemical Society 138 (49), 15821-15824, 2016
2142016
The many faces of mixed ion perovskites: unraveling and understanding the crystallization process
P Gratia, I Zimmermann, P Schouwink, JH Yum, JN Audinot, K Sivula, ...
ACS Energy Letters 2 (12), 2686-2693, 2017
2002017
A passivating contact for silicon solar cells formed during a single firing thermal annealing
A Ingenito, G Nogay, Q Jeangros, E Rucavado, C Allebé, S Eswara, ...
Nature Energy 3 (9), 800-808, 2018
1342018
High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy
T Wirtz, P Philipp, JN Audinot, D Dowsett, S Eswara
Nanotechnology 26 (43), 434001, 2015
1212015
Correlative microscopy combining secondary ion mass spectrometry and electron microscopy: comparison of intensity–hue–saturation and Laplacian pyramid methods for image fusion
F Vollnhals, JN Audinot, T Wirtz, M Mercier-Bonin, I Fourquaux, ...
Analytical chemistry 89 (20), 10702-10710, 2017
902017
Imaging and analytics on the helium ion microscope
T Wirtz, O De Castro, JN Audinot, P Philipp
Annual Review of Analytical Chemistry 12, 523-543, 2019
852019
Co-registered in situ secondary electron and mass spectral imaging on the helium ion microscope demonstrated using lithium titanate and magnesium oxide nanoparticles
D Dowsett, T Wirtz
Analytical Chemistry 89 (17), 8957-8965, 2017
802017
Towards secondary ion mass spectrometry on the helium ion microscope: An experimental and simulation based feasibility study with He+ and Ne+ bombardment
T Wirtz, N Vanhove, L Pillatsch, D Dowsett, S Sijbrandij, J Notte
Applied Physics Letters 101 (4), 2012
672012
Elemental mapping of neuromelanin organelles of human substantia nigra: Correlative ultrastructural and chemical analysis by analytical transmission electron microscopy and …
A Biesemeier, O Eibl, S Eswara, JN Audinot, T Wirtz, G Pezzoli, FA Zucca, ...
Journal of Neurochemistry 138 (2), 339-353, 2016
562016
SIMS analysis with neutral cesium deposition: Negative secondary ion sensitivity increase and quantification aspects
P Philipp, T Wirtz, HN Migeon, H Scherrer
International Journal of Mass Spectrometry 253 (1-2), 71-78, 2006
532006
Improved efficiency and reduced hysteresis in ultra-stable fully printable mesoscopic perovskite solar cells through incorporation of CuSCN into the perovskite layer
I Zimmermann, P Gratia, D Martineau, G Grancini, JN Audinot, T Wirtz, ...
Journal of materials chemistry A 7 (14), 8073-8077, 2019
512019
Analysis of hydrogen distribution and migration in fired passivating contacts (FPC)
M Lehmann, N Valle, J Horzel, A Pshenova, P Wyss, M Döbeli, ...
Solar Energy Materials and Solar Cells 200, 110018, 2019
492019
Study and optimisation of SIMS performed with He+ and Ne+ bombardment
L Pillatsch, N Vanhove, D Dowsett, S Sijbrandij, J Notte, T Wirtz
Applied surface science 282, 908-913, 2013
492013
In vitro exposure of a 3D-tetraculture representative for the alveolar barrier at the air-liquid interface to silver particles and nanowires
I Fizeșan, S Cambier, E Moschini, A Chary, I Nelissen, J Ziebel, ...
Particle and fibre toxicology 16, 1-21, 2019
402019
Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional …
T Wirtz, Y Fleming, M Gerard, U Gysin, T Glatzel, E Meyer, U Wegmann, ...
Review of Scientific Instruments 83 (6), 2012
392012
Combined SIMS‐SPM instrument for high sensitivity and high‐resolution elemental 3D analysis
T Wirtz, Y Fleming, U Gysin, T Glatzel, U Wegmann, E Meyer, U Maier, ...
Surface and interface analysis 45 (1), 513-516, 2013
372013
Correlative microscopy combining transmission electron microscopy and secondary ion mass spectrometry: A general review on the state-of-the-art, recent developments, and prospects
S Eswara, A Pshenova, L Yedra, QH Hoang, J Lovric, P Philipp, T Wirtz
Applied Physics Reviews 6 (2), 2019
362019
SIMS on the helium ion microscope: A powerful tool for high-resolution high-sensitivity nano-analytics
T Wirtz, D Dowsett, P Philipp
Helium Ion Microscopy, 297-323, 2016
362016
Combed single DNA molecules imaged by secondary ion mass spectrometry
A Cabin-Flaman, AF Monnier, Y Coffinier, JN Audinot, D Gibouin, T Wirtz, ...
Analytical Chemistry 83 (18), 6940-6947, 2011
352011
Work function shifts and variations of ionization probabilities occurring during SIMS analyses using an in situ deposition of Cs0
T Wirtz, HN Migeon
Surface science 561 (2-3), 200-207, 2004
352004
The system can't perform the operation now. Try again later.
Articles 1–20