Hugh Simons
Hugh Simons
Associate Professor, Department of Physics, Technical University of Denmark
Verified email at - Homepage
Cited by
Cited by
Dark-field X-ray microscopy for multiscale structural characterization
H Simons, A King, W Ludwig, C Detlefs, W Pantleon, S Schmidt, F Stöhr, ...
Nature communications 6 (1), 6098, 2015
Electric-field-induced strain mechanisms in lead-free 94%(Bi1/2Na1/2) TiO3–6% BaTiO3
H Simons, J Daniels, W Jo, R Dittmer, A Studer, M Avdeev, J Rödel, ...
Applied Physics Letters 98 (8), 2011
A High‐Temperature‐Capacitor Dielectric Based on K0.5Na0.5NbO3‐Modified Bi1/2Na1/2TiO3–Bi1/2K1/2TiO3
R Dittmer, EM Anton, W Jo, H Simons, JE Daniels, M Hoffman, J Pokorny, ...
Journal of the American Ceramic Society 95 (11), 3519-3524, 2012
Long-range symmetry breaking in embedded ferroelectrics
H Simons, AB Haugen, AC Jakobsen, S Schmidt, F Stöhr, M Majkut, ...
Nature materials 17 (9), 814-819, 2018
Dislocation-toughened ceramics
L Porz, AJ Klomp, X Fang, N Li, C Yildirim, C Detlefs, E Bruder, M Höfling, ...
Materials Horizons 8 (5), 1528-1537, 2021
Origin of large recoverable strain in 0.94 (Bi0. 5Na0. 5) TiO3-0.06 BaTiO3 near the ferroelectric-relaxor transition
H Simons, JE Daniels, J Glaum, AJ Studer, JL Jones, M Hoffman
Applied Physics Letters 102 (6), 2013
Dual strain mechanisms in a lead-free morphotropic phase boundary ferroelectric
J Walker, H Simons, DO Alikin, AP Turygin, VY Shur, AL Kholkin, H Ursic, ...
Scientific reports 6 (1), 19630, 2016
X-ray diffraction microscopy based on refractive optics
HF Poulsen, AC Jakobsen, H Simons, SR Ahl, PK Cook, C Detlefs
Journal of Applied Crystallography 50 (5), 1441-1456, 2017
The ESRF dark-field x-ray microscope at ID06
M Kutsal, P Bernard, G Berruyer, PK Cook, R Hino, AC Jakobsen, ...
IOP conference series: Materials science and engineering 580 (1), 012007, 2019
Multiscale 3D characterization with dark-field x-ray microscopy
H Simons, AC Jakobsen, SR Ahl, C Detlefs, HF Poulsen
Mrs Bulletin 41 (6), 454-459, 2016
Tailoring the Piezoelectric and Relaxor Properties of (Bi1/2Na1/2)TiO3–BaTiO3 via Zirconium Doping
J Glaum, H Simons, M Acosta, M Hoffman
Journal of the American Ceramic Society 96 (9), 2881-2886, 2013
Mapping of individual dislocations with dark-field X-ray microscopy
AC Jakobsen, H Simons, W Ludwig, C Yildirim, H Leemreize, L Porz, ...
Journal of Applied Crystallography 52 (1), 122-132, 2019
Conceptual framework for dislocation-modified conductivity in oxide ceramics deconvoluting mesoscopic structure, core, and space charge exemplified for SrTiO3
L Porz, T Frömling, A Nakamura, N Li, R Maruyama, K Matsunaga, ...
ACS nano 15 (6), 9355-9367, 2020
Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics
S Gorfman, H Simons, T Iamsasri, S Prasertpalichat, DP Cann, H Choe, ...
Scientific reports 6 (1), 20829, 2016
Temperature dependent piezoelectric response and strain–electric-field hysteresis of rare-earth modified bismuth ferrite ceramics
J Walker, H Ursic, A Bencan, B Malic, H Simons, I Reaney, G Viola, ...
Journal of Materials Chemistry C 4 (33), 7859-7868, 2016
Domain fragmentation during cyclic fatigue in 94%(Bi1/2Na1/2) TiO3-6% BaTiO3
H Simons, J Glaum, JE Daniels, AJ Studer, A Liess, J Rödel, M Hoffman
Journal of applied physics 112 (4), 2012
Multilayer Laue lenses at high X-ray energies: performance and applications
KT Murray, AF Pedersen, I Mohacsi, C Detlefs, AJ Morgan, M Prasciolu, ...
Optics express 27 (5), 7120-7138, 2019
Ultra-low-angle boundary networks within recrystallizing grains
SR Ahl, H Simons, YB Zhang, C Detlefs, F Stöhr, AC Jakobsen, ...
Scripta Materialia 139, 87-91, 2017
In situ visualization of long-range defect interactions at the edge of melting
LE Dresselhaus-Marais, G Winther, M Howard, A Gonzalez, SR Breckling, ...
Science Advances 7 (29), eabe8311, 2021
Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes
C Chen, T Zhou, DL Danilov, L Gao, S Benning, N Schön, S Tardif, ...
Nature communications 11 (1), 3283, 2020
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