| Low-distortion, low-loss varactor-based adaptive matching networks, implemented in a silicon-on-glass technology K Buisman, LCN De Vreede, LE Larson, M Spirito, A Akhnoukh, Y Lin, ... 2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium-Digest of …, 2005 | 44 | 2005 |
| Limits on thinning of boron layers with/without metal contacting in PureB Si (photo) diodes T Knežević, X Liu, E Hardeveld, T Suligoj, LK Nanver IEEE electron device letters 40 (6), 858-861, 2019 | 23 | 2019 |
| Nanometer-thin pure boron layers as mask for silicon micromachining X Liu, LK Nanver, TLM Scholtes Journal of Microelectromechanical Systems 26 (6), 1428-1434, 2017 | 17 | 2017 |
| Improved hybrid SiGe HBT class-AB power amplifier efficiency using varactor-based tunable matching networks WCE Neo, X Liu, Y Lin, LCN De Vreede, LE Larson, S Spirito, ... Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005 …, 2005 | 15 | 2005 |
| Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon LK Nanver, X Liu, T Knezevic 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS …, 2018 | 8 | 2018 |
| Material reliability of low-temperature boron deposition for PureB silicon photodiode fabrication LK Nanver, K Lyon, X Liu, J Italiano, J Huffman MRS Advances 3 (57-58), 3397-3402, 2018 | 8 | 2018 |
| Comparing current flows in ultrashallow pn-/Schottky-like diodes with 2-diode test method X Liu, LK Nanver 2016 International Conference on Microelectronic Test Structures (ICMTS …, 2016 | 8 | 2016 |
| Silicon micromachining with nanometer-thin boron masking and membrane material X Liu, J Italiano, R Scott, LK Nanver Materials Research Express 6 (11), 116438, 2019 | 7 | 2019 |
| PureB diode fabrication using physical or chemical vapor deposition methods for increased back-end-of-line accessibility SD Thammaiah, X Liu, T Knežević, KM Batenburg, AAI Aarnink, ... Solid-state electronics 177, 107938, 2021 | 4 | 2021 |
| Diode design for studying material defect distributions with avalanche–mode light emission M Krakers, T Knezevic, KM Batenburg, X Liu, LK Nanver 2020 IEEE 33rd International Conference on Microelectronic Test Structures …, 2020 | 3 | 2020 |
| Comparative study of thermal and radical-enhanced methods for growing boron nitride films from diborane and ammonia RO Apaydin, AJ Onnink, X Liu, AAI Aarnink, MP de Jong, DJ Gravesteijn, ... Journal of Vacuum Science & Technology A 38 (3), 2020 | 3 | 2020 |
| Back-end-of-line CMOS-compatible diode fabrication with pure boron deposition down to 50° C T Knežević, T Suligoj, X Liu, LK Nanver, A Elsayed, JF Dick, J Schulze ESSDERC 2019-49th European Solid-State Device Research Conference (ESSDERC …, 2019 | 3 | 2019 |
| Nanolayer boron-semiconductor interfaces and their device applications LK Nanver, L Qi, X Liu, T Knežević Solid-State Electronics 186, 108041, 2021 | 2 | 2021 |
| Low temperature pure boron layer deposition for silicon diode and micromachining applications X Liu | 2 | 2021 |
| On the Many Applications of Nanometer-Thin Pure Boron Layers in IC and Microelectromechanical Systems Technology LK Nanver, T Knezevic, X Liu, SD Thammaiah, M Krakers Journal of nanoscience and nanotechnology 21 (4), 2472-2482, 2021 | 2 | 2021 |
| Comparison of Selective Deposition Techniques for Fabricating p+ n Ultrashallow Silicon Diodes X Liu, SD Thammaiah, TLM Scholtes, LK Nanver Proc. ICT. OPEN-2016, 2016 | 2 | 2016 |
| Batch Furnace Chemical Vapor Deposition of Pure Boron Layers on Si and GaN Substrates for Low-Leakage-Current Diode Fabrication TTH Vu, KM Batenburg, AAI Aarnink, T Knežević, X Liu, LK Nanver | | |
