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Dahai Li
Dahai Li
Department of Optical Science & Engineering, Fudan University
Verified email at fudan.edu.cn
Title
Cited by
Cited by
Year
Optical properties of thickness-controlled MoS2 thin films studied by spectroscopic ellipsometry
D Li, X Song, J Xu, Z Wang, R Zhang, P Zhou, H Zhang, R Huang, ...
Applied Surface Science 421, 884-890, 2017
602017
Optical Constants and Band Gap Evolution with Phase Transition in Sub-20-nm-Thick TiO2 Films Prepared by ALD
YJ Shi, RJ Zhang, H Zheng, DH Li, W Wei, X Chen, Y Sun, YF Wei, HL Lu, ...
Nanoscale research letters 12 (1), 243, 2017
422017
Optical Properties of Al-Doped ZnO Films in the Infrared Region and Their Absorption Applications
H Zheng, RJ Zhang, DH Li, X Chen, SY Wang, YX Zheng, MJ Li, ZG Hu, ...
Nanoscale Research Letters 13 (1), 149, 2018
302018
Influence of hydration water on CH3NH3PbI3 perovskite films prepared through one-step procedure
Z Wang, S Yuan, D Li, F Jin, R Zhang, Y Zhan, M Lu, S Wang, Y Zheng, ...
Optics express 24 (22), A1431-A1443, 2016
272016
Dielectric functions and critical points of crystalline WS 2 ultrathin films with tunable thickness
DH Li, H Zheng, ZY Wang, RJ Zhang, H Zhang, YX Zheng, SY Wang, ...
Physical Chemistry Chemical Physics 19 (19), 12022-12031, 2017
202017
Abnormal behaviors of Goos–Hänchen shift in hyperbolic metamaterials made of aluminum zinc oxide materials
J Zhao, H Zhang, X Zhang, D Li, H Lu, M Xu
Photonics Research 1 (4), 160-163, 2013
192013
Effects of bilayer thickness on the morphological, optical, and electrical properties of Al2O3/ZnO nanolaminates
DH Li, CH Zhai, WC Zhou, QH Huang, L Wang, H Zheng, L Chen, X Chen, ...
Nanoscale research letters 12 (1), 563, 2017
132017
Electrical level of defects in single-layer two-dimensional TiO2
XF Song, LF Hu, DH Li, L Chen, QQ Sun, P Zhou, DW Zhang
Scientific reports 5, 15989, 2015
102015
Study on electrical defects level in single layer two-dimensional Ta2O5
D Li, X Song, L Hu, Z Wang, R Zhang, L Chen, DW Zhang, P Zhou
Chinese Physics B 25 (4), 047304, 2016
92016
Influence of interface layer on optical properties of sub-20 nm-thick TiO2 films
YJ Shi, RJ Zhang, DH Li, Y Zhan, HL Lu, A Jiang, X Chen, J Liu, ...
Journal of Physics D: Applied Physics, 2018
82018
一种检测UV胶水固化过程动态光学特性的方法
徐敏李大海、张浩、
CN Patent CN103,969,220 B, 2016
2016
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