Follow
Bryan Tracy
Bryan Tracy
Tesla Motors
Verified email at sonic.net
Title
Cited by
Cited by
Year
Direct electron microscopy studies of the bone—hydroxylapatite interface
BM Tracy, RH Doremus
Journal of biomedical materials research 18 (7), 719-726, 1984
3691984
Specimen preparation for transmission electron microscopy of materials 2
R AnderSon
Pittsburgh, PA (USA); Materials Research Society, 1990
691990
Copper reservoir for reducing electromigration effects associated with a conductive via in a semiconductor device
RK Klein, D Erb, S Avanzino, R Cheung, S Luning, B Tracy, S Gupta, ...
US Patent 5,770,519, 1998
361998
Use of fiducial marks for improved blank wafer defect review
BM Tracy, DL Wollesen
US Patent 5,847,821, 1998
351998
Apparatus and method to improve electromigration performance by use of amorphous barrier layer
IIRC Blish, B Tracy
US Patent 5,882,738, 1999
271999
Specimen Preparation for Transmission Electron Microscopy of Materials III
J Benedict, R Anderson, SJ Klepeis, B Tracy, J Bravman
Mater. Res. Soc. Proc 254, 121-140, 1992
251992
The formation of titanium silicide by arsenic ion beam mixing and rapid thermal annealing
RK Shukla, PW Davies, BM Tracy
Journal of Vacuum Science & Technology B: Microelectronics Processing and†…, 1986
191986
Copper pellet for reducing electromigration effects associated with a conductive via in a semiconductor device
RK Klein, DM Erb, S Avanzino, R Cheung, S Luning, B Tracy, S Gupta, ...
US Patent 5,639,691, 1997
181997
Copper pellet for reducing electromigration effects associated with a conductive via in a semiconductor device
RK Klein, DM Erb, S Avanzino, R Cheung, S Luning, B Tracy, S Gupta, ...
US Patent 5,639,691, 1997
181997
Comparison of mechanical and microstructural properties of hydrogen and silane reduced low pressure chemical vapor deposited tungsten films
S Sivaram, MLA Dass, CS Wei, B Tracy, R Shukla
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 11 (1†…, 1993
181993
TEM validation of CD AFM image reconstruction
GA Dahlen, L Mininni, M Osborn, HC Liu, JR Osborne, B Tracy, ...
Metrology, Inspection, and Process Control for Microlithography XXI 6518†…, 2007
152007
Temperature sensing probe for microthermometry
R Alvis, AN Erickson, ARR Kizchery, JD Romero, BM Tracy
US Patent 5,713,667, 1998
151998
Adopting low-voltage STEM and automated sample prep to perform IC failure analysis
B Tracy, K Alberi, S Tabrez
Micro 22 (6), 87-+, 2004
132004
Specimen Preparation for Transmission Electron Microscopy of Materials-III
DP Basile
Mater. Res. Soc. Symp. Proc. 254, 23, 1992
131992
Semiconductor wafer optical scanning system and method using swath-area defect limitation
PJ Steffan, B Tracy, MC Chen
US Patent 6,011,619, 2000
122000
Graded Ta/TaN/Ta barrier for copper interconnects for high electromigration resistance
T Nogami, YC Joo, S Lopatin, J Romero, J Bernard, W Blum, ...
1998 Advanced Metallization Conference Proc., 120-121, 1998
121998
Microstructural Science for Thin Film Metallizations in Electronic Applications
BM Tracy, PW Davies, D Fanger, P Gartman, J Sanchez, DA Smith, ...
by J. Sanchez, DA Smith, and N. DeLanerolle (TMS, 1988), 157, 1988
91988
The effect of metal film topography and lithography on grain size distributions and on electromigration performance
YE Strausser, BL Euzent, RC Smith, BM Tracy, K Wu
25th International Reliability Physics Symposium, 140-144, 1987
91987
TEM validation of CD AFM image reconstruction: part II
GA Dahlen, HC Liu, M Osborn, JR Osborne, B Tracy, A Del Rosario
Metrology, Inspection, and Process Control for Microlithography XXII 6922†…, 2008
82008
Comparative study of ion milling techniques in cross‐sectional transmission electron microscope specimen preparation
EM Zielinski, B Tracy
Microscopy research and technique 22 (2), 199-206, 1992
81992
The system can't perform the operation now. Try again later.
Articles 1–20