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Co-authors
- Juerg LeutholdInstitute of Electromagnetic Fields (IEF), ETH Zurich, Zurich, SwitzerlandVerified email at ethz.ch
- Wolfgang HeniPolariton Technologies Ltd.Verified email at polariton.ch
- Benedikt BaeuerlePolariton Technologies Ltd.Verified email at polariton.ch
- Delwin ElderResearch Scientist, University of WashingtonVerified email at uw.edu
- Christian HaffnerTenure Track IMEC, Branco-Weiss Fellow, Guest Researcher NISTVerified email at imec.be
- Larry DaltonProfessor of Chemistry, University of WashingtonVerified email at chem.washington.edu
- Arne JostenPhD Student of Optical Communications, ETH ZurichVerified email at ethz.ch
- Yannick SalaminPostdoc, MITVerified email at mit.edu
- Alexandros EmborasLecturer, Department of Information Technology and Electrical Engineering, ETH-ZurichVerified email at ethz.ch
- Andreas MessnerZurich Instruments AGVerified email at zhinst.com
- Christian HafnerETH ZurichVerified email at ethz.ch
- Tatsuhiko WatanabeInstitute of Electromagnetic Fields (IEF), ETH ZurichVerified email at ethz.ch
- Bojun ChengHKUST(GZ)Verified email at hkust-gz.edu.cn
- Ping MaETH Zurich, SwitzerlandVerified email at ief.ee.ethz.ch
- Jens NiegemannAnsys Canada Inc.Verified email at ansys.com
- Daniel ChelladuraiPhD Candidate, ETH ZurichVerified email at ief.ee.ethz.ch
- David HillerkussDirector Open XR Forum, InfineraVerified email at infinera.com
- Bruce H. RobinsonProfessor of Chemistry, University of WashingtonVerified email at uw.edu
- Alexander DorodnyyInstitute of Electromagnetic Fields ETH ZurichVerified email at ief.ee.ethz.ch
- David MoorPhD Candidate, ETH ZürichVerified email at ethz.ch
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Ueli Koch
ETH Zurich, Dept. of Information Technology and Electrical Engineering
Verified email at ethz.ch - Homepage