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Eric  K Lin
Eric K Lin
Verified email at nist.gov
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Cited by
Year
Critical role of side-chain attachment density on the order and device performance of polythiophenes
RJ Kline, DM DeLongchamp, DA Fischer, EK Lin, LJ Richter, ...
Macromolecules 40 (22), 7960-7965, 2007
4132007
High carrier mobility polythiophene thin films: structure determination by experiment and theory
DM DeLongchamp, RJ Kline, EK Lin, DA Fischer, LJ Richter, LA Lucas, ...
Advanced Materials 19 (6), 833-837, 2007
3392007
Effect of film thickness on the validity of the Sauerbrey equation for hydrated polyelectrolyte films
BD Vogt, EK Lin, W Wu, CC White
The Journal of Physical Chemistry B 108 (34), 12685-12690, 2004
3052004
Variations in semiconducting polymer microstructure and hole mobility with spin-coating speed
DM DeLongchamp, BM Vogel, Y Jung, MC Gurau, CA Richter, OA Kirillov, ...
Chemistry of materials 17 (23), 5610-5612, 2005
3022005
Measuring molecular order in poly (3-alkylthiophene) thin films with polarizing spectroscopies
MC Gurau, DM Delongchamp, BM Vogel, EK Lin, DA Fischer, ...
Langmuir 23 (2), 834-842, 2007
2612007
Reduced polymer mobility near the polymer/solid interface as measured by neutron reflectivity
EK Lin, R Kolb, SK Satija, W Wu
Macromolecules 32 (11), 3753-3757, 1999
2191999
Properties of nanoporous silica thin films determined by high-resolution x-ray reflectivity and small-angle neutron scattering
W Wu, WE Wallace, EK Lin, GW Lynn, CJ Glinka, ET Ryan, HM Ho
Journal of applied physics 87 (3), 1193-1200, 2000
2112000
Controlling the orientation of terraced nanoscale “ribbons” of a poly (thiophene) semiconductor
DM DeLongchamp, RJ Kline, Y Jung, DS Germack, EK Lin, AJ Moad, ...
Acs Nano 3 (4), 780-787, 2009
1942009
Significant dependence of morphology and charge carrier mobility on substrate surface chemistry in high performance polythiophene semiconductor films
RJ Kline, DM DeLongchamp, DA Fischer, EK Lin, M Heeney, I McCulloch, ...
Applied physics letters 90 (6), 2007
1792007
Nanoporous ultralow dielectric constant organosilicates templated by triblock copolymers
S Yang, PA Mirau, CS Pai, O Nalamasu, E Reichmanis, JC Pai, YS Obeng, ...
Chemistry of materials 14 (1), 369-374, 2002
1752002
Moisture absorption and absorption kinetics in polyelectrolyte films: influence of film thickness
BD Vogt, CL Soles, HJ Lee, EK Lin, W Wu
Langmuir 20 (4), 1453-1458, 2004
1612004
Polymer interdiffusion near an attractive solid substrate
EK Lin, W Wu, SK Satija
Macromolecules 30 (23), 7224-7231, 1997
1591997
The effect of interfacial roughness on the thin film morphology and charge transport of high‐performance polythiophenes
Y Jung, RJ Kline, DA Fischer, EK Lin, M Heeney, I McCulloch, ...
Advanced Functional Materials 18 (5), 742-750, 2008
1462008
Semicrystalline diblock copolymer platelets in dilute solution
EK Lin, AP Gast
Macromolecules 29 (12), 4432-4441, 1996
1431996
Molecular basis of mesophase ordering in a thiophene-based copolymer
DM DeLongchamp, RJ Kline, Y Jung, EK Lin, DA Fischer, DJ Gundlach, ...
Macromolecules 41 (15), 5709-5715, 2008
1372008
Moisture absorption into ultrathin hydrophilic polymer films on different substrate surfaces
BD Vogt, CL Soles, HJ Lee, EK Lin, W Wu
Polymer 46 (5), 1635-1642, 2005
1312005
Molecular templating of nanoporous ultralow dielectric constant (≈ 1.5) organosilicates by tailoring the microphase separation of triblock copolymers
S Yang, PA Mirau, CS Pai, O Nalamasu, E Reichmanis, EK Lin, HJ Lee, ...
Chemistry of materials 13 (9), 2762-2764, 2001
1292001
Small angle x-ray scattering for sub-100 nm pattern characterization
RL Jones, T Hu, EK Lin, WL Wu, R Kolb, DM Casa, PJ Bolton, GG Barclay
Applied Physics Letters 83 (19), 4059-4061, 2003
1252003
Direct measurement of the reaction front in chemically amplified photoresists
EK Lin, CL Soles, DL Goldfarb, BC Trinque, SD Burns, RL Jones, ...
Science 297 (5580), 372-375, 2002
1232002
Influence of a water rinse on the structure and properties of poly (3, 4-ethylene dioxythiophene): poly (styrene sulfonate) films
DM DeLongchamp, BD Vogt, CM Brooks, K Kano, J Obrzut, CA Richter, ...
Langmuir 21 (24), 11480-11483, 2005
1132005
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