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Laurent Karim Béland
Laurent Karim Béland
Assistant Professor, Queen's University
Verified email at queensu.ca
Title
Cited by
Cited by
Year
Influence of chemical disorder on energy dissipation and defect evolution in concentrated solid solution alloys
Y Zhang, GM Stocks, K Jin, C Lu, H Bei, BC Sales, L Wang, LK Béland, ...
Nature communications 6 (1), 8736, 2015
4682015
Direct observation of defect range and evolution in ion-irradiated single crystalline Ni and Ni binary alloys
C Lu, K Jin, LK Béland, F Zhang, T Yang, L Qiao, Y Zhang, H Bei, ...
Scientific reports 6 (1), 1-10, 2016
1592016
Kinetic activation-relaxation technique
LK Béland, P Brommer, F El-Mellouhi, JF Joly, N Mousseau
Physical Review E 84 (4), 046704, 2011
1492011
Influence of chemical disorder on energy dissipation and defect evolution in advanced alloys
Y Zhang, K Jin, H Xue, C Lu, RJ Olsen, LK Beland, MW Ullah, S Zhao, ...
Journal of Materials Research 31 (16), 2363-2375, 2016
1132016
Optimized energy landscape exploration using the ab initio based activation-relaxation technique
E Machado-Charry, LK Béland, D Caliste, L Genovese, T Deutsch, ...
The Journal of chemical physics 135 (3), 034102, 2011
1002011
On the existence and origin of sluggish diffusion in chemically disordered concentrated alloys
YN Osetsky, LK Béland, AV Barashev, Y Zhang
Current Opinion in Solid State and Materials Science 22 (3), 65-74, 2018
872018
The activation-relaxation technique: Art nouveau and kinetic art
N Mousseau, LK Béland, P Brommer, JF Joly, F El-Mellouhi, ...
Journal of Atomic and Molecular Physics 2012, 2012
782012
Specific features of defect and mass transport in concentrated fcc alloys
YN Osetsky, LK Béland, RE Stoller
Acta Materialia 115, 364-371, 2016
692016
Features of primary damage by high energy displacement cascades in concentrated Ni-based alloys
LK Béland, C Lu, YN Osetskiy, GD Samolyuk, A Caro, L Wang, RE Stoller
Journal of Applied Physics 119 (8), 085901, 2016
642016
Numerical study of the thermal ablation of wet solids by ultrashort laser pulses
D Perez, LK Béland, D Deryng, LJ Lewis, M Meunier
Physical Review B 77 (1), 014108, 2008
622008
Lattice thermal conductivity of multi-component alloys
M Caro, LK Béland, GD Samolyuk, RE Stoller, A Caro
Journal of Alloys and Compounds 648, 408-413, 2015
542015
Impact of short-range forces on defect production from high-energy collisions
RE Stoller, A Tamm, LK Béland, GD Samolyuk, GM Stocks, A Caro, ...
Journal of chemical theory and computation 12 (6), 2871-2879, 2016
472016
Understanding long-time vacancy aggregation in iron: A kinetic activation-relaxation technique study
P Brommer, LK Béland, JF Joly, N Mousseau
Physical Review B 90 (13), 134109, 2014
402014
Electron–phonon coupling in Ni-based binary alloys with application to displacement cascade modeling
GD Samolyuk, LK Béland, GM Stocks, RE Stoller
Journal of Physics: Condensed Matter 28 (17), 175501, 2016
392016
Following atomistic kinetics on experimental timescales with the kinetic Activation–Relaxation Technique
N Mousseau, LK Béland, P Brommer, F El-Mellouhi, JF Joly, ...
Computational Materials Science 100, 111-123, 2015
392015
Diffusion of point defects in crystalline silicon using the kinetic activation-relaxation technique method
M Trochet, LK Béland, JF Joly, P Brommer, N Mousseau
Physical Review B 91 (22), 224106, 2015
382015
Replenish and relax: Explaining logarithmic annealing in ion-implanted c-Si
LK Béland, Y Anahory, D Smeets, M Guihard, P Brommer, JF Joly, ...
Physical review letters 111 (10), 105502, 2013
382013
Contribution of vacancies to relaxation in amorphous materials: A kinetic activation-relaxation technique study
JF Joly, LK Béland, P Brommer, N Mousseau
Physical Review B 87 (14), 144204, 2013
382013
Differences in the accumulation of ion-beam damage in Ni and NiFe explained by atomistic simulations
LK Béland, GD Samolyuk, RE Stoller
Journal of Alloys and Compounds 662, 415-420, 2016
352016
Interstitial loop transformations in FeCr
LK Béland, YN Osetsky, RE Stoller, H Xu
Journal of Alloys and Compounds 640, 219-225, 2015
352015
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