Follow
Chengfu Ma
Title
Cited by
Cited by
Year
Detection of subsurface cavity structures using contact-resonance atomic force microscopy
C Ma, Y Chen, W Arnold, J Chu
Journal of Applied Physics 121 (15), 154301, 2017
362017
Depth-sensing using AFM contact-resonance imaging and spectroscopy at the nanoscale
C Ma, W Wang, Y Chen, W Arnold, J Chu
Journal of Applied Physics 126 (12), 124302, 2019
162019
Subsurface imaging of flexible circuits via contact resonance atomic force microscopy
W Wang, C Ma, Y Chen, L Zheng, H Liu, J Chu
Beilstein Journal of Nanotechnology 10 (1), 1636-1647, 2019
152019
Visualizing subsurface defects in graphite by acoustic atomic force microscopy
T Wang, C Ma, W Hu, Y Chen, J Chu
Microscopy research and technique 80 (1), 66-74, 2017
132017
16 nm-resolution lithography using ultra-small-gap bowtie apertures
Y Chen, J Qin, J Chen, L Zhang, C Ma, J Chu, X Xu, L Wang
Nanotechnology 28 (5), 055302, 2016
122016
Image contrast reversals in contact resonance atomic force microscopy
C Ma, Y Chen, T Wang
AIP Advances 5 (2), 027116, 2015
122015
Nanoscale ultrasonic subsurface imaging with atomic force microscopy
C Ma, W Arnold
Journal of Applied Physics 128 (18), 180901, 2020
112020
Displacement measurement with nanoscale resolution using a coded micro-mark and digital image correlation
W Huang, C Ma, Y Chen
Optical Engineering 53 (12), 124103, 2014
92014
Measuring stiffness and residual stress of thin films by contact resonance atomic force microscopy
C Ma, Y Chen, J Chen, J Chu
Applied Physics Express 9 (11), 116601, 2016
82016
Effects of temperature and humidity on atomic force microscopy dimensional measurement
T Wang, C Ma, Y Chen, J Chu, W Huang
Microscopy research and technique 78 (7), 562-568, 2015
72015
Binary coded cantilevers for enhancing multi-harmonic atomic force microscopy
Y Hou, C Ma, W Wang, Y Chen
Sensors and Actuators A: Physical 300, 111668, 2019
52019
Universal aspects of sonolubrication in amorphous and crystalline materials
V Pfahl, C Ma, W Arnold, K Samwer
Journal of Applied Physics 123 (3), 035301, 2018
52018
Stick-to-sliding transition in contact-resonance atomic force microscopy
C Ma, V Pfahl, Z Wang, Y Chen, J Chu, MK Phani, A Kumar, W Arnold, ...
Applied Physics Letters 113 (8), 083102, 2018
42018
Atomic force microscopy force‐distance curves with small amplitude ultrasonic modulation
C Ma, Y Chen, T Wang, J Chu
Scanning 37 (4), 284-293, 2015
42015
A dual-use probe for nano-metric photoelectric characterization using a confined light field generated by photonic crystals in the cantilever
Y Hou, C Ma, W Wang, Y Chen
Nano Research 14 (11), 3848-3853, 2021
32021
Measurement of undercut etching by contact resonance atomic force microscopy
W Wang, C Ma, Y Chen
Applied Physics Letters 117 (2), 023103, 2020
22020
Spectral Analysis of Irregular Roughness Artifacts Measured by Atomic Force Microscopy and Laser Scanning Microscopy
Y Chen, T Luo, C Ma, W Huang, S Gao
Microscopy and Microanalysis 20 (6), 1682-1691, 2014
22014
Quantification of the dielectric constant of MoS2 and WSe2 Nanosheets by electrostatic force microscopy
Y Hou, G Wang, C Ma, Z Feng, Y Chen, T Filleter
Materials Characterization 193, 112313, 2022
2022
Thermal noise in contact atomic force microscopy
C Ma, C Zhou, J Peng, Y Chen, W Arnold, J Chu
Journal of Applied Physics 129 (23), 234303, 2021
2021
Environmental temperature effect on dimensional measurements of atomic force microscopy
C Ma, Y Chen, W Huang
Nanotechnology and Precision Engineering 4 (2), 023003, 2021
2021
The system can't perform the operation now. Try again later.
Articles 1–20