| A new phase diagram for layered antiferromagnetic films O Hellwig, TL Kirk, JB Kortright, A Berger, EE Fullerton Nature materials 2 (2), 112-116, 2003 | 155 | 2003 |
| Coercivity mechanisms in positive exchange-biased Co films and Co/Pt multilayers TL Kirk, O Hellwig, EE Fullerton Physical Review B 65 (22), 224426, 2002 | 84 | 2002 |
| Self focusing of field emitted electrons at an ellipsoidal tip A Kyritsakis, GC Kokkorakis, JP Xanthakis, TL Kirk, D Pescia Applied Physics Letters 97 (2), 2010 | 45 | 2010 |
| Superparamagnetism in discontinuous Ni films A Frydman, TL Kirk, RC Dynes Solid state communications 114 (9), 481-486, 2000 | 30 | 2000 |
| Investigation of Nd-Ce-Cu-O planar tunnel junctions and bicrystal grain boundary junctions SI Woods, AS Katz, TL Kirk, MC De Andrade, MB Maple, RC Dynes IEEE transactions on applied superconductivity 9 (2), 3917-3920, 1999 | 20 | 1999 |
| Evidence of nonplanar field emission via secondary electron detection in near field emission scanning electron microscopy TL Kirk, O Scholder, LG De Pietro, U Ramsperger, D Pescia Applied Physics Letters 94 (15), 2009 | 19 | 2009 |
| Near field emission scanning electron microscopy TL Kirk, U Ramsperger, D Pescia Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009 | 16 | 2009 |
| A Review of Scanning Electron Microscopy in Near Field Emission Mode TL Kirk Advances in Imaging and Electron Physics 204, 39-109, 2017 | 14 | 2017 |
| Electron beam confinement and image contrast enhancement in near field emission scanning electron microscopy TL Kirk, LG De Pietro, D Pescia, U Ramsperger Ultramicroscopy 109 (5), 463-466, 2009 | 13 | 2009 |
| Nature Mater. 2, 112 (2003) O Hellwig, TL Kirk, JB Kortright, A Berger, EE Fullerton CrossRef| PubMed| CAS| Web of Science® Times Cited 45, 0 | 12 | |
| Near field emission scanning electron microscopy TL Kirk Logos Verlag Berlin GmbH, 2010 | 11 | 2010 |
| Near Field Emission SEM: Localised Electron Excitation Imaging via SPM TL Kirk, LG De Pietro, U Ramsperger, D Pescia Imaging & Microscopy 11 (1), 35-37, 2009 | 2 | 2009 |
| Lateral resolution of the NFESE microscopy and the existence of self focusing of electrons A Kyritsakis, JP Xanthakis, TL Kirk, D Pescia 2011 24th International Vacuum Nanoelectronics Conference, 21-22, 2011 | 1 | 2011 |
| STM Viewer Software TL Kirk | | 2019 |
| Magnetic Levitation Data TL Kirk | | 2019 |
| Scanning Tunneling Microscope Data TL Kirk | | 2019 |
| Field emitter experimental data collected 7 February, 2017 TL Kirk | | 2017 |
| Field emitter experimental data collected 20 March, 2017 TL Kirk | | 2017 |
| Field emitter experimental data collected 19 April, 2017 TL Kirk | | 2017 |
| Field emitter experimental data collected 26 January, 2017 TL Kirk | | 2017 |
John P XanthakisProfessor, National Technical University of Athens, School of Electrical EngVerified email at central.ntua.gr
