Orientation control of textured PZT thin films sputtered on silicon substrate with TiOx seeding R Bouregba, G Poullain, B Vilquin, H Murray Materials research bulletin 35 (9), 1381-1390, 2000 | 97 | 2000 |
Asymmetrical leakage currents as a possible origin of the polarization offsets observed in compositionally graded ferroelectric films R Bouregba, G Poullain, B Vilquin, G Le Rhun Journal of applied physics 93 (9), 5583-5591, 2003 | 54 | 2003 |
Thickness dependence of the nanoscale piezoelectric properties measured by piezoresponse force microscopy on (1 1 1)-oriented PLZT 10/40/60 thin films A Ferri, S Saitzek, A Da Costa, R Desfeux, G Leclerc, R Bouregba, ... Surface Science 602 (11), 1987-1992, 2008 | 42 | 2008 |
Effect of in situ Pt bottom electrode deposition and of Pt top electrode preparation on PZT thin films properties B Vilquin, G Le Rhun, R Bouregba, G Poullain, H Murray Applied surface science 195 (1-4), 63-73, 2002 | 40 | 2002 |
a-Axis oriented superconductive YBCO thin films: growth mechanism on MgO substrate JF Hamet, B Mercey, M Hervieu, G Poullain, B Raveau Physica C: Superconductivity 198 (3-4), 293-302, 1992 | 40 | 1992 |
Graded ferroelectric thin films: Possible origin of the shift along the polarization axis G Poullain, R Bouregba, B Vilquin, G Le Rhun, H Murray Applied physics letters 81 (26), 5015-5017, 2002 | 38 | 2002 |
A model for fatigue in ferroelectric thin films based on trapping of carriers at interfacial states G Le Rhun, G Poullain, R Bouregba Journal of applied physics 96 (7), 3876-3882, 2004 | 37 | 2004 |
Investigation of thickness dependence of the ferroelectric properties of Pb (Zr0. 6Ti0. 4) O3 thin-film capacitors R Bouregba, G Le Rhun, G Poullain, G Leclerc Journal of applied physics 99 (3), 2006 | 35 | 2006 |
Polarization loop deformations of an oxygen deficient Pb (Zr0. 25, Ti0. 75) O3 ferroelectric thin film G Le Rhun, R Bouregba, G Poullain Journal of Applied Physics 96 (10), 5712-5721, 2004 | 34 | 2004 |
Numerical extraction of the true ferroelectric polarization due to switching domains from hysteresis loops measured using a Sawyer-Tower circuit R Bouregba, G Poullain Ferroelectrics 274 (1), 165-181, 2002 | 32 | 2002 |
Correlation between local hysteresis and crystallite orientation in PZT thin films deposited on Si and MgO substrates R Desfeux, C Legrand, A Da Costa, D Chateigner, R Bouregba, ... Surface science 600 (1), 219-228, 2006 | 30 | 2006 |
Elaboration of (1 1 1)-oriented La-doped PZT thin films on platinized silicon substrates G Leclerc, B Domenges, G Poullain, R Bouregba Applied Surface Science 253 (3), 1143-1149, 2006 | 29 | 2006 |
Sawyer–Tower hysteresis measurements on micron sized capacitors R Bouregba, B Vilquin, G Le Rhun, G Poullain, B Domenges Review of Scientific Instruments 74 (10), 4429-4435, 2003 | 28 | 2003 |
Fatigue properties of oriented PZT ferroelectric thin films G Le Rhun, G Poullain, R Bouregba, G Leclerc Journal of the European Ceramic Society 25 (12), 2281-2284, 2005 | 27 | 2005 |
Orientation control of rhomboedral PZT thin films on Pt/Ti/SiO2/Si substrates B Vilquin, R Bouregba, G Poullain, M Hervieu, H Murray The European Physical Journal-Applied Physics 15 (3), 153-165, 2001 | 26 | 2001 |
Epitaxial PZT thin films on TiOx covered Pt/MgO substrate by RF magnetron sputtering R Bouregba, G Poullain, B Vilquin, H Murray Ferroelectrics 256 (1), 47-68, 2001 | 26 | 2001 |
Computation of the polarization due to the ferroelectric layer in a stacked capacitor from Sawyer–Tower hysteresis measurements R Bouregba, G Poullain Journal of applied physics 93 (1), 522-532, 2003 | 23 | 2003 |
Redox Mechanisms and Density of Holes by XAS in the Compensated Series Bi2-xPbxSr2Ca1-xYxCu2O8+ δ (0≤ x≤ 1) N Merrien, F Studer, G Poullain, C Michel, AM Flank, P Lagarde, ... Journal of Solid State Chemistry 105 (1), 112-129, 1993 | 23 | 1993 |
Conductance of silicon grain boundaries in as‐grown and annealed bicrystals G Poullain, B Mercey, G Nouet Journal of applied physics 61 (4), 1547-1552, 1987 | 23 | 1987 |
Interface depolarization field as common denominator of fatigue and size effect in Pb (Zr0. 54Ti0. 46) O3 ferroelectric thin film capacitors R Bouregba, N Sama, C Soyer, G Poullain, D Remiens Journal of Applied Physics 107 (10), 2010 | 22 | 2010 |