Paolo Scardi
Cited by
Cited by
Rietveld refinement guidelines
LB McCusker, RB Von Dreele, DE Cox, D Louër, P Scardi
Journal of Applied Crystallography 32 (1), 36-50, 1999
Simultaneous structure and size–strain refinement by the Rietveld method
L Lutterotti, P Scardi
Journal of applied Crystallography 23 (4), 246-252, 1990
Whole powder pattern modelling
P Scardi, M Leoni
Acta crystallographica section A 58 (2), 190-200, 2002
Line broadening analysis using integral breadth methods: a critical review
P Scardi, M Leoni, R Delhez
Journal of Applied Crystallography 37 (3), 381-390, 2004
Diffraction analysis of the microstructure of materials
EJ Mittemeijer, P Scardi
Springer Science & Business Media, 2013
Effect of a crystallite size distribution on X-ray diffraction line profiles and whole-powder-pattern fitting
JI Langford, D Louër, P Scardi
Journal of Applied Crystallography 33 (3), 964-974, 2000
LSI-a computer program for simultaneous refinement of material structure and microstructure
L Lutterotti, P Scardi, P Maistrelli
Journal of Applied Crystallography 25 (3), 459-462, 1992
PM2K: a flexible program implementing Whole Powder Pattern Modelling
M Leoni, T Confente, P Scardi
Ninth European Powder Diffraction Conference, 249-254, 2015
Diffraction line profiles from polydisperse crystalline systems
P Scardi, M Leoni
Acta Crystallographica Section A: Foundations of Crystallography 57 (5), 604-613, 2001
Absorption coefficient of bulk and thin film Cu2O
C Malerba, F Biccari, CLA Ricardo, M D’Incau, P Scardi, A Mittiga
Solar energy materials and solar cells 95 (10), 2848-2854, 2011
CZTS stoichiometry effects on the band gap energy
C Malerba, F Biccari, CLA Ricardo, M Valentini, R Chierchia, M Müller, ...
Journal of alloys and compounds 582, 528-534, 2014
Solar photoactivity of nano-N-TiO2 from tertiary amine: role of defects and paramagnetic species
F Spadavecchia, G Cappelletti, S Ardizzone, CL Bianchi, S Cappelli, ...
Applied Catalysis B: Environmental 96 (3-4), 314-322, 2010
Reverse bending fatigue of shot peened 7075-T651 aluminium alloy: The role of residual stress relaxation
M Benedetti, V Fontanari, P Scardi, CLA Ricardo, M Bandini
International Journal of Fatigue 31 (8-9), 1225-1236, 2009
Thermal diffusivity/microstructure relationship in Y-PSZ thermal barrier coatings
F Cernuschi, P Bianchi, M Leoni, P Scardi
Journal of Thermal Spray Technology 8, 102-109, 1999
Line profile analysis: pattern modelling versus profile fitting
P Scardi, M Leoni
Journal of applied crystallography 39 (1), 24-31, 2006
Fourier modelling of the anisotropic line broadening of X-ray diffraction profiles due to line and plane lattice defects
P Scardi, M Leoni
Journal of applied crystallography 32 (4), 671-682, 1999
Morphology, structure and chemistry of extracted diesel soot—Part I: Transmission electron microscopy, Raman spectroscopy, X-ray photoelectron spectroscopy and synchrotron X …
M Patel, CLA Ricardo, P Scardi, PB Aswath
Tribology international 52, 29-39, 2012
Phase stability of scandia–yttria-stabilized zirconia TBCs
M Leoni, RL Jones, P Scardi
Surface and coatings technology 108, 107-113, 1998
Dry and wet corrosion behaviour of AISI 304 stainless steel coated by sol-gel ZrO2 CeO2 films
R Di Maggio, L Fedrizzi, S Rossi, P Scardi
Thin Solid Films 286 (1-2), 127-135, 1996
MCX: a Synchrotron Radiation Beamline for X‐ray Diffraction Line Profile Analysis
L Rebuffi, JR Plaisier, M Abdellatief, A Lausi, P Scardi
Zeitschrift für anorganische und allgemeine Chemie 640 (15), 3100-3106, 2014
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