| Molecular layering of fluorinated ionic liquids at a charged sapphire (0001) surface M Mezger, H Schroder, H Reichert, S Schramm, JS Okasinski, S Schoder, ... Science 322 (5900), 424-428, 2008 | 681 | 2008 |
| Critical phenomena at surfaces and interfaces: evanescent X-ray and neutron scattering H Dosch Springer, 2006 | 494 | 2006 |
| Observation of five-fold local symmetry in liquid lead H Reichert, O Klein, H Dosch, M Denk, V Honkimäki, T Lippmann, ... Nature 408 (6814), 839-841, 2000 | 373 | 2000 |
| High-resolution in situ x-ray study of the hydrophobic gap at the water–octadecyl-trichlorosilane interface M Mezger, H Reichert, S Schöder, J Okasinski, H Schröder, H Dosch, ... Proceedings of the National Academy of Sciences 103 (49), 18401-18404, 2006 | 324 | 2006 |
| Organic n-channel transistors based on core-cyanated perylene carboxylic diimide derivatives RT Weitz, K Amsharov, U Zschieschang, EB Villas, DK Goswami, ... Journal of the American Chemical Society 130 (14), 4637-4645, 2008 | 287 | 2008 |
| X-ray cross correlation analysis uncovers hidden local symmetries in disordered matter P Wochner, C Gutt, T Autenrieth, T Demmer, V Bugaev, AD Ortiz, A Duri, ... Proceedings of the National Academy of Sciences 106 (28), 11511-11514, 2009 | 272 | 2009 |
| Kinetic hindrance during the initial oxidation of Pd (100) at ambient pressures E Lundgren, J Gustafson, A Mikkelsen, JN Andersen, A Stierle, H Dosch, ... Physical review letters 92 (4), 046101, 2004 | 265 | 2004 |
| Initial corrosion observed on the atomic scale FU Renner, A Stierle, H Dosch, DM Kolb, TL Lee, J Zegenhagen Nature 439 (7077), 707-710, 2006 | 256 | 2006 |
| Shape changes of supported Rh nanoparticles during oxidation and reduction cycles P Nolte, A Stierle, NY Jin-Phillipp, N Kasper, TU Schulli, H Dosch Science 321 (5896), 1654-1658, 2008 | 236 | 2008 |
| Interfacial melting of ice in contact with SiO 2 S Engemann, H Reichert, H Dosch, J Bilgram, V Honkimäki, A Snigirev Physical review letters 92 (20), 205701, 2004 | 225 | 2004 |
| Rapid roughening in thin film growth of an organic semiconductor (diindenoperylene) AC Dürr, F Schreiber, KA Ritley, V Kruppa, J Krug, H Dosch, B Struth Physical review letters 90 (1), 016104, 2003 | 225 | 2003 |
| Depth-controlled grazing-incidence diffraction of synchrotron X radiation H Dosch, BW Batterman, DC Wack Physical review letters 56 (11), 1144, 1986 | 216 | 1986 |
| Evanescent absorption in kinematic surface Bragg diffraction H Dosch Physical Review B 35 (5), 2137, 1987 | 212 | 1987 |
| Glancing-angle X-ray scattering studies of the premelting of ice surfaces H Dosch, A Lied, JH Bilgram Surface science 327 (1-2), 145-164, 1995 | 209 | 1995 |
| X-ray diffraction study of the ultrathin Al2O3 layer on NiAl (110) A Stierle, F Renner, R Streitel, H Dosch, W Drube, BC Cowie Science 303 (5664), 1652-1656, 2004 | 201 | 2004 |
| High structural order in thin films of the organic semiconductor diindenoperylene AC Dürr, F Schreiber, M Münch, N Karl, B Krause, V Kruppa, H Dosch Applied Physics Letters 81 (12), 2276-2278, 2002 | 186 | 2002 |
| Morphology and thermal stability of metal contacts on crystalline organic thin films AC Dürr, F Schreiber, M Kelsch, HD Carstanjen, H Dosch Advanced Materials 14 (13‐14), 961-963, 2002 | 182 | 2002 |
| Interplay between morphology, structure, and electronic properties at diindenoperylene-gold interfaces AC Dürr, N Koch, M Kelsch, A Rühm, J Ghijsen, RL Johnson, JJ Pireaux, ... Physical Review B 68 (11), 115428, 2003 | 165 | 2003 |
| Surface melting of ice single crystals revealed by glancing angle x-ray scattering A Lied, H Dosch, JH Bilgram Physical review letters 72 (22), 3554, 1994 | 164 | 1994 |
| Structure of Ag (111)− p (4× 4)− O: No Silver Oxide M Schmid, A Reicho, A Stierle, I Costina, J Klikovits, P Kostelnik, O Dubay, ... Physical review letters 96 (14), 146102, 2006 | 162 | 2006 |
Frank SchreiberUniversity of TuebingenVerified email at ifap.uni-tuebingen.de
