Follow
Neil Curson
Neil Curson
Professor of Nanoelectronics, London Centre for Nanotechnology, UCL
Verified email at ucl.ac.uk - Homepage
Title
Cited by
Cited by
Year
Atomically precise placement of single dopants in Si
SR Schofield, NJ Curson, MY Simmons, FJ Rueß, T Hallam, L Oberbeck, ...
Physical review letters 91 (13), 136104, 2003
4992003
Towards the fabrication of phosphorus qubits for a silicon quantum computer
JL O’Brien, SR Schofield, MY Simmons, RG Clark, AS Dzurak, NJ Curson, ...
Physical Review B 64 (16), 161401, 2001
2772001
Toward atomic-scale device fabrication in silicon using scanning probe microscopy
FJ Ruess, L Oberbeck, MY Simmons, KEJ Goh, AR Hamilton, T Hallam, ...
Nano Letters 4 (10), 1969-1973, 2004
2152004
Quantum engineering at the silicon surface using dangling bonds
SR Schofield, P Studer, CF Hirjibehedin, NJ Curson, G Aeppli, DR Bowler
Nature communications 4 (1), 1649, 2013
1982013
Encapsulation of phosphorus dopants in silicon for the fabrication of a quantum computer
L Oberbeck, NJ Curson, MY Simmons, R Brenner, AR Hamilton, ...
Applied physics letters 81 (17), 3197-3199, 2002
1242002
Progress in silicon-based quantum computing
RG Clark, R Brenner, TM Buehler, V Chan, NJ Curson, AS Dzurak, ...
Philosophical Transactions of the Royal Society of London. Series A …, 2003
902003
Thermal dissociation and desorption of on Si(001): A reinterpretation of spectroscopic data
HF Wilson, O Warschkow, NA Marks, NJ Curson, SR Schofield, ...
Physical Review B—Condensed Matter and Materials Physics 74 (19), 195310, 2006
822006
Phosphine dissociation on the Si (001) surface
HF Wilson, O Warschkow, NA Marks, SR Schofield, NJ Curson, PV Smith, ...
Physical review letters 93 (22), 226102, 2004
812004
Measurement of phosphorus segregation in silicon at the atomic scale using scanning tunneling microscopy
L Oberbeck, NJ Curson, T Hallam, MY Simmons, G Bilger, RG Clark
Applied Physics Letters 85 (8), 1359-1361, 2004
742004
Nondestructive imaging of atomically thin nanostructures buried in silicon
G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki, SR Schofield, ...
Science advances 3 (6), e1602586, 2017
702017
Phosphine adsorption and dissociation on the Si(001) surface: An ab initio survey of structures
O Warschkow, HF Wilson, NA Marks, SR Schofield, NJ Curson, PV Smith, ...
Physical Review B—Condensed Matter and Materials Physics 72 (12), 125328, 2005
612005
Scanning probe microscopy for silicon device fabrication
MY Simmons, FJ Ruess, KEJ Goh, T Hallam, SR Schofield, L Oberbeck, ...
Molecular Simulation 31 (6-7), 505-515, 2005
602005
STM characterization of the Si-P heterodimer
NJ Curson, SR Schofield, MY Simmons, L Oberbeck, JL O’brien, RG Clark
Physical Review B 69 (19), 195303, 2004
592004
Single photon detection with a quantum dot transistor
AJ Shields, MP O'Sullivan, I Farrer, DA Ritchie, ML Leadbeater, NK Patel, ...
Japanese Journal of Applied Physics 40 (3S), 2058, 2001
572001
Atomic-scale patterning of arsenic in silicon by scanning tunneling microscopy
TJZ Stock, O Warschkow, PC Constantinou, J Li, S Fearn, E Crane, ...
ACS nano 14 (3), 3316-3327, 2020
532020
Reaction paths of phosphine dissociation on silicon (001)
O Warschkow, NJ Curson, SR Schofield, NA Marks, HF Wilson, ...
The Journal of Chemical Physics 144 (1), 2016
502016
Valence surface electronic states on Ge (001)
MW Radny, GA Shah, SR Schofield, PV Smith, NJ Curson
Physical review letters 100 (24), 246807, 2008
452008
Phosphine dissociation and diffusion on Si (001) observed at the atomic scale
SR Schofield, NJ Curson, O Warschkow, NA Marks, HF Wilson, ...
The Journal of Physical Chemistry B 110 (7), 3173-3179, 2006
452006
Ballistic transport in a one-dimensional channel fabricated using an atomic force microscope
NJ Curson, R Nemutudi, NJ Appleyard, M Pepper, DA Ritchie, GAC Jones
Applied Physics Letters 78 (22), 3466-3468, 2001
452001
Towards the atomic-scale fabrication of a silicon-based solid state quantum computer
MY Simmons, SR Schofield, JL O’Brien, NJ Curson, L Oberbeck, T Hallam, ...
Surface science 532, 1209-1218, 2003
412003
The system can't perform the operation now. Try again later.
Articles 1–20