Markus Kratzer
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Atomic force microscopy based manipulation of graphene using dynamic plowing lithography
B Vasić, M Kratzer, A Matković, A Nevosad, U Ralević, D Jovanović, ...
Nanotechnology 24 (1), 015303, 2012
Effects of polymethylmethacrylate-transfer residues on the growth of organic semiconductor molecules on chemical vapor deposited graphene
M Kratzer, BC Bayer, PR Kidambi, A Matković, R Gajić, A Cabrero-Vilatela, ...
Applied physics letters 106 (10), 2015
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
I Beinik, M Kratzer, A Wachauer, L Wang, RT Lechner, C Teichert, C Motz, ...
Journal of applied physics 110 (5), 2011
Growth and desorption kinetics of ultrathin Zn layers on Pd (111)
G Weirum, M Kratzer, HP Koch, A Tamtogl, J Killmann, I Bako, A Winkler, ...
The Journal of Physical Chemistry C 113 (22), 9788-9796, 2009
Adsorption/desorption of H2 and CO on Zn-modified Pd (111)
A Tamtögl, M Kratzer, J Killman, A Winkler
The Journal of chemical physics 129 (22), 2008
Inkjet printing of soft, stretchable optical waveguides through the photopolymerization of high-profile linear patterns
A Samusjew, M Kratzer, A Moser, C Teichert, KK Krawczyk, T Griesser
ACS applied materials & interfaces 9 (5), 4941-4947, 2017
Principal factors of contact charging of minerals for a successful triboelectrostatic separation process–a review
M Mirkowska, M Kratzer, C Teichert, H Flachberger
Berg Huettenmaenn Monatsh 161 (8), 359-382, 2016
UV-induced modulation of the conductivity of polyaniline: towards a photo-patternable charge injection layer for structured organic light emitting diodes
T Griesser, SV Radl, T Koepplmayr, A Wolfberger, M Edler, A Pavitschitz, ...
Journal of materials chemistry 22 (7), 2922-2928, 2012
Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM
I Beinik, M Kratzer, A Wachauer, L Wang, YP Piryatinski, G Brauer, ...
Beilstein journal of nanotechnology 4 (1), 208-217, 2013
Anti-adhesive layers on stainless steel using thermally stable dipodal perfluoroalkyl silanes
B Kaynak, C Alpan, M Kratzer, C Ganser, C Teichert, W Kern
Applied surface science 416, 824-833, 2017
Piezoelectric Properties of Zinc Oxide Thin Films Grown by Plasma‐Enhanced Atomic Layer Deposition
T Abu Ali, J Pilz, P Schäffner, M Kratzer, C Teichert, B Stadlober, ...
physica status solidi (a) 217 (21), 2000319, 2020
Interfacial Band Engineering of MoS2/Gold Interfaces Using Pyrimidine‐Containing Self‐Assembled Monolayers: Toward Contact‐Resistance‐Free Bottom‐Contacts
A Matković, A Petritz, G Schider, M Krammer, M Kratzer, E Karner‐Petritz, ...
Advanced Electronic Materials 6 (5), 2000110, 2020
Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%
L Kormoš, M Kratzer, K Kostecki, M Oehme, T Šikola, E Kasper, J Schulze, ...
Surface and interface analysis 49 (4), 297-302, 2017
Epitaxy of highly ordered organic semiconductor crystallite networks supported by hexagonal boron nitride
A Matković, J Genser, D Lüftner, M Kratzer, R Gajić, P Puschnig, ...
Scientific reports 6 (1), 38519, 2016
Thin film growth of aromatic rod-like molecules on graphene
M Kratzer, C Teichert
Nanotechnology 27 (29), 292001, 2016
Reconstruction of the domain orientation distribution function of polycrystalline PZT ceramics using vector piezoresponse force microscopy
M Kratzer, M Lasnik, S Röhrig, C Teichert, M Deluca
Scientific Reports 8 (1), 422, 2018
Atomic force microscopy as a tool to explore triboelectrostatic phenomena in mineral processing
M Mirkowska, M Kratzer, C Teichert, H Flachberger
Chemie Ingenieur Technik 86 (6), 857-864, 2014
Probing charge transfer between molecular semiconductors and graphene
A Matković, M Kratzer, B Kaufmann, J Vujin, R Gajić, C Teichert
Scientific reports 7 (1), 9544, 2017
Preparation and calibration of ultrathin Zn layers on Pd (1 1 1)
M Kratzer, A Tamtögl, J Killmann, R Schennach, A Winkler
Applied surface science 255 (11), 5755-5759, 2009
Adsorption and epitaxial growth of small organic semiconductors on hexagonal boron nitride
M Kratzer, A Matkovic, C Teichert
Journal of Physics D: Applied Physics 52 (38), 383001, 2019
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