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MARTA PORTELA GARCIA
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Year
Autonomous fault emulation: A new FPGA-based acceleration system for hardness evaluation
C Lopez-Ongil, M Garcia-Valderas, M Portela-García, L Entrena
IEEE Transactions on Nuclear Science 54 (1), 252-261, 2007
1672007
Soft error sensitivity evaluation of microprocessors by multilevel emulation-based fault injection
L Entrena, M Garcia-Valderas, R Fernandez-Cardenal, A Lindoso, ...
IEEE Transactions on Computers 61 (3), 313-322, 2012
1442012
FPGAs and parallel architectures for aerospace applications
F Kastensmidt, P Rech
Soft Errors and Fault-Tolerant Design, 2016
572016
Fault injection in modern microprocessors using on-chip debugging infrastructures
M Portela-Garcia, C Lopez-Ongil, MG Valderas, L Entrena
IEEE Transactions on Dependable and Secure Computing 8 (2), 308-314, 2011
512011
A unified environment for fault injection at any design level based on emulation
C Lopez-Ongil, L Entrena, M Garcia-Valderas, M Portela, MA Aguirre, ...
IEEE Transactions on Nuclear Science 54 (4), 946-950, 2007
512007
SET emulation considering electrical masking effects
L Entrena, MG Valderas, RF Cardenal, MP García, CL Ongil
IEEE Transactions on Nuclear Science 56 (4), 2021-2025, 2009
452009
Efficient mitigation of data and control flow errors in microprocessors
L Parra, A Lindoso, M Portela, L Entrena, F Restrepo-Calle, ...
IEEE Transactions on Nuclear Science 61 (4), 1590-1596, 2014
372014
A rapid fault injection approach for measuring seu sensitivity in complex processors
M Portela-Garcia, C Lopez-Ongil, M Garcia-Valderas, L Entrena
13th IEEE International On-Line Testing Symposium (IOLTS 2007), 101-106, 2007
372007
On the use of embedded debug features for permanent and transient fault resilience in microprocessors
M Portela-García, M Grosso, M Gallardo-Campos, MS Reorda, L Entrena, ...
Microprocessors and Microsystems 36 (5), 334-343, 2012
342012
Online Test of Control Flow Errors: A New Debug Interface-Based Approach
B Du, MS Reorda, L Sterpone, L Parra, M Portela-Garcia, A Lindoso, ...
IEEE Transactions on Computers 65 (6), 1846-1855, 2016
312016
An on-line fault detection technique based on embedded debug features
M Grosso, MS Reorda, M Portela-Garcia, M García-Valderas, ...
2010 IEEE 16th International On-Line Testing Symposium, 167-172, 2010
302010
HW/SW Co-Simulation System for Enhancing Hardware-in-the-Loop of Power Converter Digital Controllers
A Fernández-Álvarez, M Portela-García, M García-Valderas, J López, ...
IEEE Journal of Emerging and Selected Topics in Power Electronics 5 (4 …, 2017
282017
Fault injection-based reliability evaluation of SoPCs
MS Reorda, L Sterpone, M Violante, M Portela-García, C López-Ongil, ...
Eleventh IEEE European Test Symposium (ETS'06), 75-82, 2006
282006
Autonomous transient fault emulation on FPGAs for accelerating fault grading
C Lopez-Ongil, M Garcia-Valderas, M Portela-Garcfa, L Entrena-Arrontes
11th IEEE International On-Line Testing Symposium, 43-48, 2005
252005
A new hybrid nonintrusive error-detection technique using dual control-flow monitoring
L Parra, A Lindoso, M Portela-Garcia, L Entrena, B Du, MS Reorda, ...
IEEE Transactions on Nuclear Science 61 (6), 3236-3243, 2014
212014
SET emulation under a quantized delay model
M García Valderas, L Entrena, R Fernández Cardenal, C López Ongil, ...
Journal of Electronic Testing 25, 107-116, 2009
212009
Fear recognition for women using a reduced set of physiological signals
JA Miranda, M F. Canabal, L Gutierrez-Martin, JM Lanza-Gutierrez, ...
Sensors 21 (5), 1587, 2021
182021
Advanced simulation and emulation techniques for fault injection
MG Valderas, MP Garcia, RF Cardenal, CL Ongil, L Entrena
2007 IEEE International Symposium on Industrial Electronics, 3339-3344, 2007
172007
Embedded emotion recognition: Autonomous multimodal affective internet of things
JA Miranda, MF Canabal, M Portela García, C Lopez-Ongil
Proceedings of the cyber-physical systems workshop 2208, 22-29, 2018
162018
Analysis of SET effects in a PIC microprocessor for selective hardening
L Entrena, A Lindoso, MG Valderas, M Portela, CL Ongil
IEEE Transactions on Nuclear Science 58 (3), 1078-1085, 2011
162011
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