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Adrian Nievergelt
Adrian Nievergelt
EMBO and HFSP Fellow at MPI-CBG
Verified email at mpi-cbg.de - Homepage
Title
Cited by
Cited by
Year
High-speed photothermal off-resonance atomic force microscopy reveals assembly routes of centriolar scaffold protein SAS-6
AP Nievergelt, N Banterle, SH Andany, P Gönczy, GE Fantner
Nature nanotechnology 13 (8), 696-701, 2018
1142018
High-resolution correlative microscopy: bridging the gap between single molecule localization microscopy and atomic force microscopy
PD Odermatt, A Shivanandan, H Deschout, R Jankele, AP Nievergelt, ...
Nano letters 15 (8), 4896-4904, 2015
1092015
Harnessing the damping properties of materials for high-speed atomic force microscopy
JD Adams, BW Erickson, J Grossenbacher, J Brugger, A Nievergelt, ...
Nature nanotechnology 11 (2), 147-151, 2016
1082016
Single-molecule kinetics of pore assembly by the membrane attack complex
ES Parsons, GJ Stanley, ALB Pyne, AW Hodel, AP Nievergelt, A Menny, ...
Nature communications 10 (1), 2066, 2019
842019
Detecting topological variations of DNA at single-molecule level
K Liu, C Pan, A Kuhn, AP Nievergelt, GE Fantner, O Milenkovic, ...
Nature communications 10 (1), 3, 2019
622019
Division site selection linked to inherited cell surface wave troughs in mycobacteria
HA Eskandarian, PD Odermatt, JXY Ven, M Hannebelle, AP Nievergelt, ...
Nature microbiology 2 (9), 1-6, 2017
612017
High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers
JD Adams, A Nievergelt, BW Erickson, C Yang, M Dukic, GE Fantner
Review of Scientific Instruments 85 (9), 2014
562014
Studying biological membranes with extended range high-speed atomic force microscopy
AP Nievergelt, BW Erickson, N Hosseini, JD Adams, GE Fantner
Scientific reports 5 (1), 11987, 2015
542015
A high frequency sensor for optical beam deflection atomic force microscopy
R Enning, D Ziegler, A Nievergelt, R Friedlos, K Venkataramani, ...
Review of scientific instruments 82 (4), 2011
482011
High-frequency multimodal atomic force microscopy
AP Nievergelt, JD Adams, PD Odermatt, GE Fantner
Beilstein journal of nanotechnology 5 (1), 2459-2467, 2014
462014
Time-resolved scanning ion conductance microscopy for three-dimensional tracking of nanoscale cell surface dynamics
SM Leitao, B Drake, K Pinjusic, X Pierrat, V Navikas, AP Nievergelt, ...
ACS nano 15 (11), 17613-17622, 2021
392021
A monolithic MEMS position sensor for closed-loop high-speed atomic force microscopy
N Hosseini, AP Nievergelt, JD Adams, VT Stavrov, GE Fantner
Nanotechnology 27 (13), 135705, 2016
272016
Overlapping and essential roles for molecular and mechanical mechanisms in mycobacterial cell division
PD Odermatt, MTM Hannebelle, HA Eskandarian, AP Nievergelt, ...
Nature physics 16 (1), 57-62, 2020
232020
Photothermal off-resonance tapping for rapid and gentle atomic force imaging of live cells
AP Nievergelt, C Brillard, HA Eskandarian, JD McKinney, GE Fantner
International journal of molecular sciences 19 (10), 2984, 2018
232018
Large‐range HS‐AFM imaging of DNA self‐assembly through in situ data‐driven control
AP Nievergelt, C Kammer, C Brillard, E Kurisinkal, MMC Bastings, ...
Small Methods 3 (7), 1900031, 2019
222019
Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy
M Dukic, V Todorov, S Andany, AP Nievergelt, C Yang, N Hosseini, ...
Review of Scientific Instruments 88 (12), 2017
202017
Encased cantilevers for low-noise force and mass sensing in liquids
D Ziegler, A Klaassen, D Bahri, D Chmielewski, A Nievergelt, F Mugele, ...
2014 IEEE 27th International Conference on Micro Electro Mechanical Systems …, 2014
152014
Conversion of anterograde into retrograde trains is an intrinsic property of intraflagellar transport
AP Nievergelt, I Zykov, D Diener, A Chhatre, TO Buchholz, M Delling, ...
Current Biology 32 (18), 4071-4078. e4, 2022
122022
Data-driven controller design for atomic-force microscopy
C Kammer, AP Nievergelt, GE Fantner, A Karimi
IFAC-PapersOnLine 50 (1), 10437-10442, 2017
122017
Components for high-speed atomic force microscopy optimized for low phase-lag
AP Nievergelt, SH Andany, JD Adams, MTM Hannebelle, GE Fantner
2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM …, 2017
112017
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