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Henrique Leonel Gomes
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Dynamics of threshold voltage shifts in organic and amorphous silicon field-effect transistors
SGJ Mathijssen, M Colle, H Gomes, ECP Smits, B de Boer, I McCulloch, ...
Advanced materials 19 (19), 2785-+, 2007
2882007
Gate-bias stress in amorphous oxide semiconductors thin-film transistors
ME Lopes, HL Gomes, MCR Medeiros, P Barquinha, L Pereira, ...
Applied Physics Letters 95 (6), 2009
2642009
Bias-induced threshold voltages shifts in thin-film organic transistors
HL Gomes, P Stallinga, F Dinelli, M Murgia, F Biscarini, DM De Leeuw, ...
Applied Physics Letters 84 (16), 3184-3186, 2004
2542004
Reproducible resistive switching in nonvolatile organic memories
F Verbakel, SCJ Meskers, RAJ Janssen, HL Gomes, M Cölle, M Büchel, ...
Applied Physics Letters 91 (19), 2007
1472007
Effect of oxygen on the electrical characteristics of field effect transistors formed from electrochemically deposited films of poly (3-methylthiophene)
DM Taylor, HL Gomes, AE Underhill, S Edge, PI Clemenson
Journal of Physics D: Applied Physics 24 (11), 2032, 1991
1441991
Electrical characterization of the rectifying contact between aluminium and electrodeposited poly (3-methylthiophene)
DM Taylor, HL Gomes
Journal of Physics D: Applied Physics 28 (12), 2554, 1995
1141995
Electrical instabilities in organic semiconductors caused by trapped supercooled water
HL Gomes, P Stallinga, M Cölle, DM De Leeuw, F Biscarini
Applied Physics Letters 88 (8), 2006
1082006
All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis
E Sowade, E Ramon, KY Mitra, C Martínez-Domingo, M Pedró, J Pallarès, ...
Scientific reports 6 (1), 33490, 2016
1072016
Electronic transport in field-effect transistors of sexithiophene
P Stallinga, HL Gomes, F Biscarini, M Murgia, DM De Leeuw
Journal of applied physics 96 (9), 5277-5283, 2004
1042004
Electrochemical noise and impedance of Au electrode/electrolyte interfaces enabling extracellular detection of glioma cell populations
PRF Rocha, P Schlett, U Kintzel, V Mailänder, LKJ Vandamme, G Zeck, ...
Scientific reports 6 (1), 34843, 2016
1002016
Up-scaling of the manufacturing of all-inkjet-printed organic thin-film transistors: Device performance and manufacturing yield of transistor arrays
E Sowade, KY Mitra, E Ramon, C Martinez-Domingo, F Villani, F Loffredo, ...
Organic Electronics 30, 237-246, 2016
882016
Interface state mapping in a Schottky barrier of the organic semiconductor terrylene
P Stallinga, HL Gomes, M Murgia, K Müllen
organic Electronics 3 (1), 43-51, 2002
732002
Improving positive and negative bias illumination stress stability in parylene passivated IGZO transistors
A Kiazadeh, HL Gomes, P Barquinha, J Martins, A Rovisco, JV Pinto, ...
Applied Physics Letters 109 (5), 2016
722016
Electrical characterization of organic based transistors: stability issues
HL Gomes, P Stallinga, F Dinelli, M Murgia, F Biscarini, DM de Leeuw, ...
Polymers for Advanced technologies 16 (2‐3), 227-231, 2005
722005
Analysis of deep levels in a phenylenevinylene polymer by transient capacitance methods
HL Gomes, P Stallinga, H Rost, AB Holmes, MG Harrison, RH Friend
Applied physics letters 74 (8), 1144-1146, 1999
551999
Switching in polymeric resistance random-access memories (RRAMS)
HL Gomes, ARV Benvenho, DM De Leeuw, M Cölle, P Stallinga, ...
Organic Electronics 9 (1), 119-128, 2008
502008
Trap states as an explanation for the Meyer–Neldel rule in semiconductors
P Stallinga, HL Gomes
Organic Electronics 6 (3), 137-141, 2005
482005
Memristors using solution-based IGZO nanoparticles
J Rosa, A Kiazadeh, L Santos, J Deuermeier, R Martins, HL Gomes, ...
ACS omega 2 (11), 8366-8372, 2017
462017
Thin-film field-effect transistors: The effects of traps on the bias and temperature dependence of field-effect mobility, including the Meyer–Neldel rule
P Stallinga, HL Gomes
Organic Electronics 7 (6), 592-599, 2006
442006
Ultralow power microfuses for write-once read-many organic memory elements
BC de Brito, ECP Smits, PA van Hal, TCT Geuns, B de Boer, ...
Advanced materials 20 (19), 3750-+, 2008
432008
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