Webb R*
Webb R*
Surrey or Salford or Monterey
Verified email at surrey.ac.uk
TitleCited byYear
Simulated annealing analysis of Rutherford backscattering data
NP Barradas, C Jeynes, RP Webb
Applied Physics Letters 71 (2), 291-293, 1997
6641997
Elemental thin film depth profiles by ion beam analysis using simulated annealing-a new tool
C Jeynes, NP Barradas, PK Marriott, G Boudreault, M Jenkin, E Wendler, ...
Journal of Physics D: Applied Physics 36 (7), R97, 2003
1922003
“Total IBA”–Where are we?
C Jeynes, MJ Bailey, NJ Bright, ME Christopher, GW Grime, BN Jones, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012
862012
The new Surrey ion beam analysis facility
A Simon, C Jeynes, RP Webb, R Finnis, Z Tabatabaian, PJ Sellin, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004
722004
Accurate RBS measurements of the indium content of InGaAs thin films
C Jeynes, ZH Jafri, RP Webb, AC Kimber, MJ Ashwin
Surface and Interface Analysis: An International Journal devoted to the …, 1997
711997
Chemical characterization of latent fingerprints by matrix-assisted laser desorption ionization, time-of-flight secondary ion mass spectrometry, mega electron volt secondary …
MJ Bailey, NJ Bright, RS Croxton, S Francese, LS Ferguson, S Hinder, ...
Analytical chemistry 84 (20), 8514-8523, 2012
702012
Energy spike generation and quenching processesin ion bombardment induced amorphizationof solids
G Carter, DG Armour, SE Donnelly, R Webb
Radiation Effects 36 (1-2), 1-13, 1978
651978
Rapid detection of cocaine, benzoylecgonine and methylecgonine in fingerprints using surface mass spectrometry
MJ Bailey, R Bradshaw, S Francese, TL Salter, C Costa, M Ismail, ...
Analyst 140 (18), 6254-6259, 2015
642015
Computer-simulated energy and angular distributions of sputtered Cu atoms
MH Shapiro, PK Haff, TA Tombrello, DE Harrison Jr, RP Webb
Radiation Effects 89 (3-4), 243-255, 1985
641985
Internal Energy of Molecules Ejected Due to Energetic C60 Bombardment
BJ Garrison, Z Postawa, KE Ryan, JC Vickerman, RP Webb, N Winograd
Analytical chemistry 81 (6), 2260-2267, 2009
612009
The accumulation of amorphousness as a function of irradiation fluence in a composite model of disorder production
G Carter, R Webb
Radiation Effects 43 (1), 19-24, 1979
611979
Energetic fullerene interactions with a graphite surface
R Smith, RP Webb
Proceedings of the Royal Society of London. Series A: Mathematical and …, 1993
591993
Unambiguous automatic evaluation of multiple ion beam analysis data with simulated annealing
NP Barradas, C Jeynes, RP Webb, U Kreissig, R Grötzschel
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1999
521999
Computer simulation of pit formation in metals by ion bombardment
RP Webb, DE Harrison Jr
Physical Review Letters 50 (19), 1478, 1983
521983
Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS
MJ Bailey, BN Jones, S Hinder, J Watts, S Bleay, RP Webb
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2010
512010
The effects of ion implantation on the interdiffusion coefficients in InxGa1−xAs/GaAs quantum well structures
IV Bradley, WP Gillin, KP Homewood, RP Webb
Journal of applied physics 73 (4), 1686-1692, 1993
511993
The injection of inert gas ions into solids: their trapping and escape
G Carter, DG Armour, SE Donnelly, DC Ingram, RP Webb
Radiation Effects 53 (3-4), 143-173, 1980
511980
Difficulties in deducing disordering mechanisms from experimental studies of disorder-ion fluence functions in ion irradiation of semiconductors
R Webb, G Carter
Radiation Effects 42 (3-4), 159-168, 1979
511979
Enhanced imaging of developed fingerprints using mass spectrometry imaging
MJ Bailey, M Ismail, S Bleay, N Bright, ML Elad, Y Cohen, B Geller, ...
Analyst 138 (21), 6246-6250, 2013
482013
A second-order erosion slowness theory of the development of surface topography by ion-induced sputtering
G Carter, MJ Nobes, RP Webb
Journal of Materials Science 16 (8), 2091-2102, 1981
481981
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Articles 1–20