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W. Y. Zhang
W. Y. Zhang
Globalfoundries USA, National University of Singapore
Verified email at globalfoundries.com
Title
Cited by
Cited by
Year
Nanostructure of calcium silicate hydrate gels in cement paste
X Zhang, W Chang, T Zhang, CK Ong
Journal of the American Ceramic Society 83 (10), 2600-2604, 2000
1432000
Electron-beam assisted platinum deposition as a protective layer for FIB and TEM applications
WY Kwong, WY Zhang
ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005 …, 2005
302005
Photoluminescence and photoelectron spectroscopic analysis of InGaAsN grown by metalorganic chemical vapor deposition
W Chang, J Lin, W Zhou, SJ Chua, ZC Feng
Applied physics letters 79 (27), 4497-4499, 2001
142001
Application of IR-OBIRCH to the failure analysis of CMOS integrated circuits
L Soon, DTM Ling, M Kuan, KW Yee, D Cheong, G Zhang
Proceedings of the 10th International Symposium on the Physical and Failure …, 2003
122003
Study of TDDB reliability in misaligned via chain structures
W Liu, YK Lim, JB Tan, WY Zhang, H Liu, SY Siah
2012 IEEE International Reliability Physics Symposium (IRPS), 3A. 4.1-3A. 4.6, 2012
112012
Infrared reflection investigation of ion‐implanted and post‐implantation‐annealed epitaxially grown 6H‐SiC
W Chang, ZC Feng, J Lin, R Liu, ATS Wee, K Tone, JH Zhao
Surface and Interface Analysis: An International Journal devoted to the …, 2002
102002
Study of electric field—based lifetime projection method in IMD TDDB
W Zhang, X Zeng, W Liu, YK Lim, JF Liu, EC Chua
2010 IEEE International Reliability Physics Symposium, 938-942, 2010
62010
Reliability improvement in Al metallization: a combination of statistical prediction and failure analytical methodology
G Zhang, CM Tan, KT Tan, KY Sim, WY Zhang
Microelectronics Reliability 44 (9-11 SPEC. ISS.), 1843-1848, 2004
62004
An overview of the fast injection-extraction kicker systems of the Brookhaven AGS-booster complex
W Zhang, R Sanders, A Soukas, J Tuozzolo
Proceedings of the 1999 Particle Accelerator Conference (Cat. No. 99CH36366 …, 1999
61999
New insight in BEOL TDDB Cu diffusion mechanism: A constant current stress approach
T Shen, H Jiang, W Zhang, T Cahyadi, EC Chua, C Capasso
2014 IEEE International Reliability Physics Symposium, 3A. 5.1-3A. 5.5, 2014
52014
Surface and interface properties of ion implanted 4H-silicon carbide
WY Chang, ZC Feng, J Lin, F Yan, JH Zhao
International Journal of Modern Physics B 16 (01n02), 151-158, 2002
52002
Effect of chemical mechanical polishing scratch on TDDB reliability and its reduction in 45nm BEOL process
W Liu, YK Lim, F Zhang, WY Zhang, CQ Chen, BC Zhang, JB Tan, ...
2009 IEEE International Reliability Physics Symposium, 613-618, 2009
42009
Infrared reflectance study of 3C-SiC grown on Si by chemical vapor deposition
ZC Feng, CW Huang, WY Chang, J Zhao, CC Tin, WJ Lu, WE Collins
Materials science forum 527, 695-698, 2006
42006
Optical characterization of ion-implanted 4H-SiC
ZC Feng, F Yan, WY Chang, JH Zhao, J Lin
Materials Science Forum 389 (1), 647-650, 2002
42002
A PFN and transmission line simulation method for energy discharge systems
W Zhang, SY Zhang, AV Soukas, WW Frey
Nineteenth IEEE Symposium on Power Modulators, 74-79, 1990
41990
附加质量法在梨园混凝土面板堆石坝压实度检测中的应用
张维熙, 钱启立
水利水电技术 44 (5), 27-30, 2013
32013
Research and development of RHIC injection kicker upgrade with nano second FID pulse generator
W Zhang, J Sandberg, H Hahn, W Fischer, CJ Liaw, C Pai, J Tuozzolo
Brookhaven National Lab.(BNL), Upton, NY (United States). Relativistic Heavy …, 2012
32012
Research and development toward the RHIC injection kicker upgrade
W Zhang, W Fischer, H Hahn, C Pai, J Sandberg, J Tuozzolo
Proceedings of 2011 Particle Accelerator Conference, 1211-1213, 2011
32011
Oxide particle induced leakage in flash memory endurance test
W Zhang, SH Tan
2006 IEEE International Reliability Physics Symposium Proceedings, 608-610, 2006
32006
Construction and power test of the extraction kicker magnet for Spallation Neutron Source accumulator ring
C Pai, H Hahn, H Hseuh, Y Lee, W Meng, J Mi, J Sandberg, R Todd, ...
Proceedings of the 2005 Particle Accelerator Conference, 3831-3833, 2005
32005
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