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Ondrej Krivanek
Ondrej Krivanek
Nion Co., Arizona State U.
Verified email at nion.com - Homepage
Title
Cited by
Cited by
Year
Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
OL Krivanek, MF Chisholm, V Nicolosi, TJ Pennycook, GJ Corbin, ...
Nature 464 (7288), 571-574, 2010
14412010
Sub-ångstrom resolution using aberration corrected electron optics
PE Batson, N Dellby, OL Krivanek
Nature 418 (6898), 617-620, 2002
11662002
Towards sub-Å electron beams
OL Krivanek, N Dellby, AR Lupini
Ultramicroscopy 78 (1-4), 1-11, 1999
7911999
Surface roughness at the Si(100)- interface
SM Goodnick, DK Ferry, CW Wilmsen, Z Liliental, D Fathy, OL Krivanek
Physical Review B 32 (12), 8171, 1985
7521985
Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy
DA Muller, LF Kourkoutis, M Murfitt, JH Song, HY Hwang, J Silcox, ...
Science 319 (5866), 1073-1076, 2008
7452008
Vibrational spectroscopy in the electron microscope
OL Krivanek, TC Lovejoy, N Dellby, T Aoki, RW Carpenter, P Rez, ...
Nature 514 (7521), 209-212, 2014
7442014
Direct sub-angstrom imaging of a crystal lattice
PD Nellist, MF Chisholm, N Dellby, OL Krivanek, MF Murfitt, ZS Szilagyi, ...
Science 305 (5691), 1741-1741, 2004
6792004
EELS atlas: a reference collection of electron energy loss spectra covering all stable elements
CC Ahn, OL Krivanek, RP Burgner, MM Disko, PR Swann
(No Title), 1983
4801983
Spectroscopic imaging of single atoms within a bulk solid
M Varela, SD Findlay, AR Lupini, HM Christen, AY Borisevich, N Dellby, ...
Physical Review Letters 92 (9), 095502, 2004
3972004
An electron microscope for the aberration-corrected era
OL Krivanek, GJ Corbin, N Dellby, BF Elston, RJ Keyse, MF Murfitt, ...
Ultramicroscopy 108 (3), 179-195, 2008
3772008
ELNES of 3d transition-metal oxides: II. Variations with oxidation state and crystal structure
JH Paterson, OL Krivanek
Ultramicroscopy 32 (4), 319-325, 1990
2681990
Parallel detection electron spectrometer using quadrupole lenses
OL Krivanek, CC Ahn, RB Keeney
Ultramicroscopy 22 (1-4), 103-115, 1987
2541987
Towards sub-0.5 Å electron beams
OL Krivanek, PD Nellist, N Dellby, MF Murfitt, Z Szilagyi
Ultramicroscopy 96 (3-4), 229-237, 2003
2372003
Gentle STEM: ADF imaging and EELS at low primary energies
OL Krivanek, N Dellby, MF Murfitt, MF Chisholm, TJ Pennycook, ...
Ultramicroscopy 110 (8), 935-945, 2010
2292010
Site-specific valence determination by electron energy-loss spectroscopy
J Taftø, OL Krivanek
Physical Review Letters 48 (8), 560, 1982
2291982
Applications of slow-scan CCD cameras in transmission electron microscopy
OL Krivanek, PE Mooney
Ultramicroscopy 49 (1-4), 95-108, 1993
2111993
High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy
OL Krivanek, JP Ursin, NJ Bacon, GJ Corbin, N Dellby, P Hrncirik, ...
Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2009
2002009
Lattice imaging of a grain boundary in crystalline germanium
OL Krivanek, S Isoda, K Kobayashi
Philosophical Magazine 36 (4), 931-940, 1977
1901977
Design and first applications of a post-column imaging filter
OL Krivanek, AJ Gubbens, N Dellby, CE Meyer
Microscopy Microanalysis Microstructures 3 (2-3), 187-199, 1992
1831992
Identification of site-specific isotopic labels by vibrational spectroscopy in the electron microscope
JA Hachtel, J Huang, I Popovs, S Jansone-Popova, JK Keum, J Jakowski, ...
Science 363 (6426), 525-528, 2019
1702019
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